Atom Probe Characterization of Nanoscale Precipitates in Aluminum Alloys

Atomic Probe Field Ion Microscopy (APFIM) is used to solve many critical problems related to microstructures of metallic materials such as nanostructures that are composed of nanoscale precipitates dispersed in a matrix phase. The atom probe technique provides unique information on metallic nanostructures not attainable with other analytical microscopy techniques such as Transmission Electron Microscopy (TEM). In this article the an overview of the contribution of the atom probe technique to enhance the current understanding of solute clustering and characterization of fine precipitates of aluminum alloys.