利用白光干涉测量法改进高压测量光学传感器

J.C. Santos, K. Hidaka, A. Cortes, L.P.C. da Silva
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引用次数: 9

摘要

提出了一种利用光电口袋传感器测量高电压电平电位的新方法。本文介绍了白光干涉测量技术在高压光纤测量系统中的应用。利用WLI系统的特性,即信息编码于光的光谱中,本文提出了一种补偿方法,使测量与光纤链路传输的光功率无关。建立了一个原型,并在60 Hz交流电压高达60 kV的激励下进行了测试,显示出良好的响应,证明了该方法的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved optical sensor for high voltage measurement using white light interferometry
A new approach to perform measurement of potentials in high voltage levels using electrooptical Pockets sensors is presented. This paper describes an application of the White Light Interferometry (WLI) technique to a high voltage optical fiber measurement system. Making use of a characteristic of WLI systems, in which the information is encoded in the spectrum of the light, a compensation method is here proposed allowing the measurement to be independent of the optical power transmitted by the optical fiber link. A prototype was built and tested under excitation of a.c. voltages up to 60 kV in 60 Hz showing good response and demonstrating the feasibility of this method.
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