{"title":"p -回溯:一种新的概率扫描链诊断方法","authors":"Tae Hyun Kim, Hyunyul Lim, Sungho Kang","doi":"10.1109/ISOCC.2016.7799827","DOIUrl":null,"url":null,"abstract":"Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, \"p-backtracking\", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISCAS'89 benchmark circuits show that p-backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.","PeriodicalId":278207,"journal":{"name":"2016 International SoC Design Conference (ISOCC)","volume":"331 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"P-backtracking: A new scan chain diagnosis method with probability\",\"authors\":\"Tae Hyun Kim, Hyunyul Lim, Sungho Kang\",\"doi\":\"10.1109/ISOCC.2016.7799827\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, \\\"p-backtracking\\\", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISCAS'89 benchmark circuits show that p-backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.\",\"PeriodicalId\":278207,\"journal\":{\"name\":\"2016 International SoC Design Conference (ISOCC)\",\"volume\":\"331 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International SoC Design Conference (ISOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISOCC.2016.7799827\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC.2016.7799827","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
P-backtracking: A new scan chain diagnosis method with probability
Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, "p-backtracking", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISCAS'89 benchmark circuits show that p-backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.