减少故障识别的测试次数

E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan
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引用次数: 16

摘要

得到了足以识别系统故障单元的测试轮数的界限。在一轮测试中,每个单元最多只能参加一次测试。作者给出了一种自适应算法,该算法工作在O(log/sub (n/t)//sup /)轮中,并使用O(n)个测试。新边界内的乘法常数很小;两种情况都是4。这是对之前的非自适应和自适应算法的重大改进,后者需要O(t+log n)轮测试和O(n+t)轮测试。如果t>n/sup 1- epsilon /,则算法在常数轮数内运行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On minimizing testing rounds for fault identification
A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<>
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