W(011)表面超薄铁膜的SFEMPA磁性分析

A. Thamm, Jiapeng Wei, M. Demydenko, D. Pescia, U. Ramsperger
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引用次数: 0

摘要

将超高真空扫描隧道显微镜(STM)转换为无透镜低能扫描电子显微镜,当尖端与目标距离在几十纳米左右时,尖端作为场发射电子源。初级电子束局部激发出样品中的次级电子。根据它们的自旋分析了那些逃离尖端-目标结的粒子。我们利用该技术在室温下测量了W(011)上超薄铁膜的局部磁化强度与外加磁场的关系。得到的迟滞回线是方形的。矫顽场强度在2.2层(0.07 T)和3层(0.025 T)之间最大,在2.7层时大于0.1 T,在6层时减小到0.0075 T。讨论了磁化的旋转、不完整层的畴壁钉钉和铁膜内的晶格失配作为这种“奇异”行为的可能解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Magnetic Analysis of Ultrathin Fe Films on W(011) with SFEMPA
An ultra-high vacuum Scanning Tunneling Microscope (STM) is converted into a lens-less low-energy Scanning Electron Microscope when the tip-target distance is some tens of nanometers and the tip acts as a source of field emitted electrons. This primary electron beam excites locally secondary electrons out of the sample. Those escaping the tip-target junction are analyzed according to their spin. We use this technology to measure the local magnetization versus applied magnetic field in ultrathin Fe films on W(011) at room temperature. The resulting hysteresis loop is square. The coercive field has its maximum strength between 2.2 monolayers (0.07 T) and 3 monolayers (0.025 T), being larger than 0.1 T at 2.7 monolayers and decreasing to 0.0075 T at 6 monolayers. Rotation of the magnetization, domain wall pinning at incomplete layers and lattice misfits within the Fe films are discussed as possible explanations of this “singular” behavior.
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