Yuanlong Deng, F. Luo, Yubin Wu, Xiaopin Zhong
{"title":"聚合物偏光片视觉缺陷的简易检测技术","authors":"Yuanlong Deng, F. Luo, Yubin Wu, Xiaopin Zhong","doi":"10.1109/ICINFA.2013.6720463","DOIUrl":null,"url":null,"abstract":"In order to inspect the visual defects of polymer polarizer, an off-line automatic optical system (AOI) is proposed in this paper. It employs a plane CCD camera to capture the image of polarizer, and the Vision-Development-Module (VDM) © to process and analyze the image. Simple algorithm to determine the key parameters, such as the range of gray level equalization and the segmentation threshold, is implemented in the LabVIEW2012©. Experimental results demonstrate the validity of the algorithm, and classification, location and size of visual defects are extracted successfully.","PeriodicalId":250844,"journal":{"name":"2013 IEEE International Conference on Information and Automation (ICIA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A simple inspection technique of visual defects of polymer polarizer\",\"authors\":\"Yuanlong Deng, F. Luo, Yubin Wu, Xiaopin Zhong\",\"doi\":\"10.1109/ICINFA.2013.6720463\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to inspect the visual defects of polymer polarizer, an off-line automatic optical system (AOI) is proposed in this paper. It employs a plane CCD camera to capture the image of polarizer, and the Vision-Development-Module (VDM) © to process and analyze the image. Simple algorithm to determine the key parameters, such as the range of gray level equalization and the segmentation threshold, is implemented in the LabVIEW2012©. Experimental results demonstrate the validity of the algorithm, and classification, location and size of visual defects are extracted successfully.\",\"PeriodicalId\":250844,\"journal\":{\"name\":\"2013 IEEE International Conference on Information and Automation (ICIA)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Conference on Information and Automation (ICIA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICINFA.2013.6720463\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference on Information and Automation (ICIA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICINFA.2013.6720463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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