利用布尔可满足性进行设计诊断

Alexander Smith, A. Veneris, Anastasios Viglas
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引用次数: 77

摘要

布尔可满足性的最新进展使其成为解决许多数字VLSI设计问题(如验证,模型检查,优化和测试生成)的有吸引力的引擎。现有的基于可满足性的解决方案没有解决故障诊断和逻辑调试问题。我们试图通过对这些问题提出基于满意度的解决方案来弥合这一差距。所提出的公式直观,易于实现。它表明,满意度捕获了重要的问题特征,并提供了不同的权衡。它还为基于满意度的诊断工具和诊断特定满意度算法提供了新的机会。理论和实验验证了这些说法,并证明了它的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design diagnosis using Boolean satisfiability
Recent advances in Boolean satisfiability have made it an attractive engine for solving many digital VLSI design problems such as verification, model checking, optimization and test generation. Fault diagnosis and logic debugging have not been addressed by existing satisfiability-based solutions. We attempt to bridge this gap by proposing a satisfiability-based solution to these problems. The proposed formulation is intuitive and easy to implement. It shows that satisfiability captures significant problem characteristics and it offers different trade-offs. It also provides new opportunities for satisfiability-based diagnosis tools and diagnosis-specific satisfiability algorithms. Theory and experiments validate the claims and demonstrate its potential.
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