1.0 cm2碳化硅SGTO的DV/DT抗扰度和恢复时间性能

A. Ogunniyi, H. O’Brien, C. Scozzie, W. Shaheen, A. Agarwal, Lin Cheng, V. Temple
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引用次数: 3

摘要

碳化硅SGTO是一种未来的开关元件技术,对陆军的各种脉冲功率应用很感兴趣。本文研究了1.0 cm2碳化硅(SiC)超级栅关断晶闸管(sgto)的dV/dt抗扰度和恢复时间(Tq)性能。1.0 cm2 SiC SGTO是目前报道的最大的基于芯片的碳化硅晶闸管。SiC SGTO由SPCO和Cree公司设计,Cree公司负责制造。与之前在PPC 2009上报道的较小的SiC GTO相比,这项工作突出了在恢复时间和瞬态电压抗扰度方面的改进结果。脉冲评估结果表明,SiC SGTO不需要辅助栅极关断,在1.7 kA的1 ms宽脉冲电流下,对应的作用电平为1.445 × 103 A2s,恢复时间小于25 μs。最后,对SiC SGTO的抗dV/dt性能进行了评价,瞬时上升时间大于9 kV/μs。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DV/DT immunity and recovery time capability of 1.0 cm2 silicon carbide SGTO
The silicon carbide SGTO is a future switching component technology of interest to the Army for various pulsed power applications. The research presented in this paper investigates the dV/dt immunity and recovery time (Tq) capability of 1.0 cm2 silicon carbide (SiC) super gate turn-off thyristors (SGTOs). The 1.0 cm2 SiC SGTO is the largest chip based silicon carbide thyristor reported. The SiC SGTO was designed by SPCO and Cree Inc., while the fabrication was done by Cree Inc. This work highlights improved results for both the recovery time and transient voltage immunity compared to the smaller SiC GTO that was previously reported at PPC 2009. The pulse evaluation results in this work show that the SiC SGTO did not require assisted gate turn-off and achieved a recovery time less than 25 μs after a 1-ms wide current pulse current of 1.7 kA, corresponding to an action level of 1.445 × 103 A2s. Finally, the SiC SGTO was evaluated for dV/dt immunity with an instantaneous rise time greater than 9 kV/μs.
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