P.J.C. Rodrigues, Michael J. Howes, J. R. Richardson
{"title":"直接使用MESFET的物理模型,在非线性CAD中","authors":"P.J.C. Rodrigues, Michael J. Howes, J. R. Richardson","doi":"10.1109/MWSYM.1992.188319","DOIUrl":null,"url":null,"abstract":"The authors present a CAD (computer-aided design) tool which combines a novel quasi-two-dimensional MESFET physical model with an efficient nonlinear circuit analysis technique. Device technological parameters (dimensions, doping profile, etc.) can be directly related to electrical performance with this tool, which can therefore be used in nonlinear circuit yield study and optimization. An excellent agreement between simulated and measured results was obtained.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"61 9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Direct use of a MESFET physical model, in nonlinear CAD\",\"authors\":\"P.J.C. Rodrigues, Michael J. Howes, J. R. Richardson\",\"doi\":\"10.1109/MWSYM.1992.188319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a CAD (computer-aided design) tool which combines a novel quasi-two-dimensional MESFET physical model with an efficient nonlinear circuit analysis technique. Device technological parameters (dimensions, doping profile, etc.) can be directly related to electrical performance with this tool, which can therefore be used in nonlinear circuit yield study and optimization. An excellent agreement between simulated and measured results was obtained.<<ETX>>\",\"PeriodicalId\":165665,\"journal\":{\"name\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"volume\":\"61 9\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1992.188319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.188319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct use of a MESFET physical model, in nonlinear CAD
The authors present a CAD (computer-aided design) tool which combines a novel quasi-two-dimensional MESFET physical model with an efficient nonlinear circuit analysis technique. Device technological parameters (dimensions, doping profile, etc.) can be directly related to electrical performance with this tool, which can therefore be used in nonlinear circuit yield study and optimization. An excellent agreement between simulated and measured results was obtained.<>