{"title":"欢迎来到2013年IEEE WMED大会","authors":"T. Hollis","doi":"10.1109/WMED.2013.6544491","DOIUrl":null,"url":null,"abstract":"On behalf of the Organizing Committee, it is my pleasure to welcome you to the 2013 IEEE Workshop on Microelectronics and Electron Devices (WMED); a professional workshop hosted by the Boise Chapter of the IEEE Electron Devices Society (EDS). For eleven years, the WMED technical program has brought world renowned researchers to the Mountain West to discuss the progress of semiconductor-related technologies. This year, we are thrilled to be joined by several distinguished speakers, who will present their perspectives on a variety of important topics ranging from emerging device technologies, to next generation device fabrication, all the way to the larger systems which will take advantage of the enhanced device characteristics. I wish to share with each of our speakers my sincere appreciation for his or her contribution to the 2013 technical program.","PeriodicalId":134493,"journal":{"name":"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Welcome to the 2013 IEEE WMED\",\"authors\":\"T. Hollis\",\"doi\":\"10.1109/WMED.2013.6544491\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On behalf of the Organizing Committee, it is my pleasure to welcome you to the 2013 IEEE Workshop on Microelectronics and Electron Devices (WMED); a professional workshop hosted by the Boise Chapter of the IEEE Electron Devices Society (EDS). For eleven years, the WMED technical program has brought world renowned researchers to the Mountain West to discuss the progress of semiconductor-related technologies. This year, we are thrilled to be joined by several distinguished speakers, who will present their perspectives on a variety of important topics ranging from emerging device technologies, to next generation device fabrication, all the way to the larger systems which will take advantage of the enhanced device characteristics. I wish to share with each of our speakers my sincere appreciation for his or her contribution to the 2013 technical program.\",\"PeriodicalId\":134493,\"journal\":{\"name\":\"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WMED.2013.6544491\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WMED.2013.6544491","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On behalf of the Organizing Committee, it is my pleasure to welcome you to the 2013 IEEE Workshop on Microelectronics and Electron Devices (WMED); a professional workshop hosted by the Boise Chapter of the IEEE Electron Devices Society (EDS). For eleven years, the WMED technical program has brought world renowned researchers to the Mountain West to discuss the progress of semiconductor-related technologies. This year, we are thrilled to be joined by several distinguished speakers, who will present their perspectives on a variety of important topics ranging from emerging device technologies, to next generation device fabrication, all the way to the larger systems which will take advantage of the enhanced device characteristics. I wish to share with each of our speakers my sincere appreciation for his or her contribution to the 2013 technical program.
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