{"title":"一种新型的无损检测相控阵控制装置","authors":"M. A. Campbell, A. McNab","doi":"10.1109/ULTSYM.1985.198663","DOIUrl":null,"url":null,"abstract":"A low cost instrument to control a phased array for NDE is described. It uses a monolithic array fabricated on a PZT substrate and designed for the contact testing of steel at 5 MHz. A microprocessor, an IBM FC, controls the system for both the firing of the array elements and the subsequent processing of received data prior to its display. A CCD delay line is used in a novel manner to acquire the data by the application of a type of quadrature sampling, providing an effective sampling frequency of 50 MHz. Factors influencing the design of the array are described with experimental results being presented.","PeriodicalId":240321,"journal":{"name":"IEEE 1985 Ultrasonics Symposium","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Novel Instrument for the Control of a Phased Array for NDE\",\"authors\":\"M. A. Campbell, A. McNab\",\"doi\":\"10.1109/ULTSYM.1985.198663\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A low cost instrument to control a phased array for NDE is described. It uses a monolithic array fabricated on a PZT substrate and designed for the contact testing of steel at 5 MHz. A microprocessor, an IBM FC, controls the system for both the firing of the array elements and the subsequent processing of received data prior to its display. A CCD delay line is used in a novel manner to acquire the data by the application of a type of quadrature sampling, providing an effective sampling frequency of 50 MHz. Factors influencing the design of the array are described with experimental results being presented.\",\"PeriodicalId\":240321,\"journal\":{\"name\":\"IEEE 1985 Ultrasonics Symposium\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1985 Ultrasonics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.1985.198663\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1985 Ultrasonics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1985.198663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Novel Instrument for the Control of a Phased Array for NDE
A low cost instrument to control a phased array for NDE is described. It uses a monolithic array fabricated on a PZT substrate and designed for the contact testing of steel at 5 MHz. A microprocessor, an IBM FC, controls the system for both the firing of the array elements and the subsequent processing of received data prior to its display. A CCD delay line is used in a novel manner to acquire the data by the application of a type of quadrature sampling, providing an effective sampling frequency of 50 MHz. Factors influencing the design of the array are described with experimental results being presented.
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