{"title":"实用的mil -航空航天光收发器资格","authors":"M. Pez","doi":"10.1109/AVFOP.2013.6661582","DOIUrl":null,"url":null,"abstract":"This invited paper presents a summary of qualification data and tests applied for harsh environment optical interconnect solutions and more especially optical transceivers.","PeriodicalId":347022,"journal":{"name":"2013 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pragmatic MIL-aerospace optical transceiver qualifications\",\"authors\":\"M. Pez\",\"doi\":\"10.1109/AVFOP.2013.6661582\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This invited paper presents a summary of qualification data and tests applied for harsh environment optical interconnect solutions and more especially optical transceivers.\",\"PeriodicalId\":347022,\"journal\":{\"name\":\"2013 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP)\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AVFOP.2013.6661582\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AVFOP.2013.6661582","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This invited paper presents a summary of qualification data and tests applied for harsh environment optical interconnect solutions and more especially optical transceivers.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
