定义功率半导体器件的标准性能等级

I. Budihardjo, P. Lauritzen, K. Wong, R. Darling, H. Mantooth
{"title":"定义功率半导体器件的标准性能等级","authors":"I. Budihardjo, P. Lauritzen, K. Wong, R. Darling, H. Mantooth","doi":"10.1109/IAS.1995.530423","DOIUrl":null,"url":null,"abstract":"Model validation for power semiconductor devices is classified into five levels with model performance features and applications defined for each level. The five levels for each device correspond to: basic, accurate, thermal, failure and degradation models. Whenever they exist, examples of device models are identified for each power semiconductor device.","PeriodicalId":117576,"journal":{"name":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"Defining standard performance levels for power semiconductor devices\",\"authors\":\"I. Budihardjo, P. Lauritzen, K. Wong, R. Darling, H. Mantooth\",\"doi\":\"10.1109/IAS.1995.530423\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Model validation for power semiconductor devices is classified into five levels with model performance features and applications defined for each level. The five levels for each device correspond to: basic, accurate, thermal, failure and degradation models. Whenever they exist, examples of device models are identified for each power semiconductor device.\",\"PeriodicalId\":117576,\"journal\":{\"name\":\"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IAS.1995.530423\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.1995.530423","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22

摘要

功率半导体器件的模型验证分为五个级别,每个级别定义了模型性能特征和应用。每个设备的五个级别对应于:基本,精确,热,失效和退化模型。只要存在,就为每个功率半导体器件确定器件模型的示例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defining standard performance levels for power semiconductor devices
Model validation for power semiconductor devices is classified into five levels with model performance features and applications defined for each level. The five levels for each device correspond to: basic, accurate, thermal, failure and degradation models. Whenever they exist, examples of device models are identified for each power semiconductor device.
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