Wen-Chau Liu, L. Laih, J. Tsai, Jing-Yuh Chen, Wei-Chou Wang, Po-Hung Lin
{"title":"阶梯掺杂沟道异质结构场效应晶体管的研究","authors":"Wen-Chau Liu, L. Laih, J. Tsai, Jing-Yuh Chen, Wei-Chou Wang, Po-Hung Lin","doi":"10.1109/COMMAD.1996.610120","DOIUrl":null,"url":null,"abstract":"Two kinds of heterostructure field-effect transistor (FET) with an InGaAs step-doped-channel (SDC) profile have been fabricated and demonstrated. For the 1/spl times/100 /spl mu/m/sup 2/ gated dimension, the maximum drain saturation currents were 735 and 675 mA/mm, the maximum transconductances 200 and 232 mS/mm, the gate breakdown voltages 15 V and 12 V, and the wide gate voltage swing 3.3 and 2.6 V with transconductance g/sub m/ higher than 150 mS/mm. A simple model is employed to analyze the performance of threshold voltage V/sub T/ and values of -3.7 and -1.8 V are obtained. These good performances show that the SDCFET has a good potential for high-speed, high-power circuit applications.","PeriodicalId":171952,"journal":{"name":"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Investigation of step-doped channel heterostructure field-effect transistor\",\"authors\":\"Wen-Chau Liu, L. Laih, J. Tsai, Jing-Yuh Chen, Wei-Chou Wang, Po-Hung Lin\",\"doi\":\"10.1109/COMMAD.1996.610120\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two kinds of heterostructure field-effect transistor (FET) with an InGaAs step-doped-channel (SDC) profile have been fabricated and demonstrated. For the 1/spl times/100 /spl mu/m/sup 2/ gated dimension, the maximum drain saturation currents were 735 and 675 mA/mm, the maximum transconductances 200 and 232 mS/mm, the gate breakdown voltages 15 V and 12 V, and the wide gate voltage swing 3.3 and 2.6 V with transconductance g/sub m/ higher than 150 mS/mm. A simple model is employed to analyze the performance of threshold voltage V/sub T/ and values of -3.7 and -1.8 V are obtained. These good performances show that the SDCFET has a good potential for high-speed, high-power circuit applications.\",\"PeriodicalId\":171952,\"journal\":{\"name\":\"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMMAD.1996.610120\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.1996.610120","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of step-doped channel heterostructure field-effect transistor
Two kinds of heterostructure field-effect transistor (FET) with an InGaAs step-doped-channel (SDC) profile have been fabricated and demonstrated. For the 1/spl times/100 /spl mu/m/sup 2/ gated dimension, the maximum drain saturation currents were 735 and 675 mA/mm, the maximum transconductances 200 and 232 mS/mm, the gate breakdown voltages 15 V and 12 V, and the wide gate voltage swing 3.3 and 2.6 V with transconductance g/sub m/ higher than 150 mS/mm. A simple model is employed to analyze the performance of threshold voltage V/sub T/ and values of -3.7 and -1.8 V are obtained. These good performances show that the SDCFET has a good potential for high-speed, high-power circuit applications.