SOI SRAM存储单元的超低电压设计考虑

O. Thomas, A. Amara
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引用次数: 4

摘要

本文介绍了一种专门用于部分耗尽SOI (PD-SOI) SRAM存储单元的系统设计方法。为了考虑到与PD-SOI浮体晶体管相关的二次效应,我们调整了传统的设计方法。该方法已应用于传统的6晶体管SRAM电池和我们开发的4晶体管自刷新电池。采用130 nm PD-SOI技术进行了仿真比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultra low voltage design considerations of SOI SRAM memory cells
This paper introduces a systematic design methodology dedicated to partially depleted SOI (PD-SOI) SRAM memory cells. We have adapted the conventional design methods in order to take into account the secondary effects that are related to the PD-SOI floating body transistor. The method has been applied both to a conventional 6-transistor SRAM cell and a 4-transistor self-refresh cell we have developed. Comparisons based on simulations using a 130 nm PD-SOI technology are presented.
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