使用粒子采样和控制隐式表面

A. Witkin, Paul S. Heckbert
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引用次数: 380

摘要

我们提出了一种新的基于粒子的隐式曲面采样和控制方法。当粒子和表面移动时,一个简单的约束将一组粒子锁定在一个表面上。我们用这个约束让表面跟随粒子,让粒子跟随表面。我们通过指定粒子运动来实现直接操作的控制点,然后求解维持约束的表面运动。对于采样和渲染,我们在另一个方向上运行约束,创建在表面上自由漫游的漂浮粒子。局部斥力被用来使漂浮物均匀地分布在表面上。通过自适应地改变斥力半径,并根据局部密度裂变或杀死粒子,我们可以非常快速地获得良好的采样分布,并且即使面对快速和极端的变形和表面拓扑变化也能保持它们。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Using particles to sample and control implicit surfaces
We present a new particle-based approach to sampling and controlling implicit surfaces. A simple constraint locks a set of particles onto a surface while the particles and the surface move. We use the constraint to make surfaces follow particles, and to make particles follow surfaces. We implement control points for direct manipulation by specifying particle motions, then solving for surface motion that maintains the constraint. For sampling and rendering, we run the constraint in the other direction, creating floater particles that roam freely over the surface. Local repulsion is used to make floaters spread evenly across the surface. By varying the radius of repulsion adaptively, and fissioning or killing particles based on the local density, we can achieve good sampling distributions very rapidly, and maintain them even in the face of rapid and extreme deformations and changes in surface topology.
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