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引用次数: 31
摘要
K. Hird等人(2002)引入了一种新的覆盖定义和度量，称为“PCOLA/SOQ”模型，它在允许对电路板上缺陷的测试覆盖进行合理的测量和比较方面具有很大的效用。本文在此框架下讨论了测量边界扫描测试覆盖率的一般问题。结论是，当在电路板上实现边界扫描时，边界扫描测试提供了大量的测试覆盖率，即使该实现是部分的。然而，如示例所示，对于PCOLA/SOQ模型中的某些缺陷，覆盖率并不完美。
Defect coverage of boundary-scan tests: what does it mean when a boundary-scan test passes?
A new coverage definition and metric, called the 'PCOLA/SOQ" model, introduced in K. Hird et al. (2002), has great utility in allowing the test coverage of defects on boards to be measured and compared rationally. This paper discusses the general topic of measuring test coverage of boundary-scan tests within this framework. A conclusion is that boundary-scan tests offer a large amount of test coverage when boundary-scan is implemented on a board, even if that implementation is partial. However, coverage is not perfect for certain defects in the PCOLA/SOQ model, as shown by example.
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