{"title":"v型微屏蔽线的准静态TEM分析","authors":"M. Perić, S. Ilic, A. Vučković, N. Raicevic","doi":"10.1109/TELSIKS52058.2021.9606319","DOIUrl":null,"url":null,"abstract":"This paper presents a hybrid boundary element method analysis of single and coupled V-shaped microshield lines. The numerical results show quasi-static values of the characteristic impedance and the effective relative permittivity of those lines. The obtained results are presented graphically and in tables. The numerical accuracy of applied method is verified through the results obtained using a software simulation.","PeriodicalId":228464,"journal":{"name":"2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Quasi-Static TEM Analysis of V-Shaped Microshield Lines\",\"authors\":\"M. Perić, S. Ilic, A. Vučković, N. Raicevic\",\"doi\":\"10.1109/TELSIKS52058.2021.9606319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a hybrid boundary element method analysis of single and coupled V-shaped microshield lines. The numerical results show quasi-static values of the characteristic impedance and the effective relative permittivity of those lines. The obtained results are presented graphically and in tables. The numerical accuracy of applied method is verified through the results obtained using a software simulation.\",\"PeriodicalId\":228464,\"journal\":{\"name\":\"2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TELSIKS52058.2021.9606319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TELSIKS52058.2021.9606319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Quasi-Static TEM Analysis of V-Shaped Microshield Lines
This paper presents a hybrid boundary element method analysis of single and coupled V-shaped microshield lines. The numerical results show quasi-static values of the characteristic impedance and the effective relative permittivity of those lines. The obtained results are presented graphically and in tables. The numerical accuracy of applied method is verified through the results obtained using a software simulation.