在低功耗CMOS晶圆上集成薄膜体声谐振器(FBAR)的极低相位噪声b类和c类振荡器的比较设计

R. Pokharel, G. Zhang, S. Amalina, K. Hikichi, K. Hashimoto, S. Taniguchi
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引用次数: 1

摘要

本文分别采用薄膜体声谐振器(FBAR)对b类和c类拓扑下的CMOS交叉耦合振荡器进行了对比设计,以改善相位噪声和功耗。本文将讨论FBAR在CMOS晶圆上的低频稳定性、相位噪声问题和优化方法等设计问题。并对实验结果和性能进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparative design of extremely low phase noise oscillator in Class-B and Class-C by integrating film bulk acoustic resonator (FBAR) on CMOS wafer for low power applications
This paper presents the comparative design of a CMOS cross-coupled oscillator in class-B and Class-C topology, respectively using film bulk acoustic resonator (FBAR) in order to improve the phase noise and power consumption. The design issues such as low frequency stability, phase noise issues and optimization method of FBAR on a CMOS wafer will will be discussed. Experiment results and performance comparision will be discussed.
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