{"title":"比较Fowler-Nordheim情节和Murphy-Good情节的表现","authors":"Mohammad M. Allaham, M. Mousa, R. Forbes","doi":"10.1109/IVNC49440.2020.9203392","DOIUrl":null,"url":null,"abstract":"Field electron emission studies normally use Fowler-Nordheim (FN) plots to analyze measured current-voltage characteristics. More precise extraction of emitter characterization parameters could perhaps be achieved if the data were plotted as a so-called “Murphy-Good (MG) plot”. Unlike a Fowler-Nordheim plot, which is theoretically predicted to be slightly curved, a Murphy-Good plot is predicted to be “almost exactly” straight. This presentation gives relevant theoretical formulas, and reports a comparison between these two plot types, based on the use of simulated data. It is confirmed that a MG plot can be used to apply an orthodoxy test. And it is illustrated that a MG plot gives results for extracted characterization parameters that are more precise than those extracted from a FN plot.","PeriodicalId":292538,"journal":{"name":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Comparing the performance of Fowler-Nordheim plots and Murphy-Good plots\",\"authors\":\"Mohammad M. Allaham, M. Mousa, R. Forbes\",\"doi\":\"10.1109/IVNC49440.2020.9203392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field electron emission studies normally use Fowler-Nordheim (FN) plots to analyze measured current-voltage characteristics. More precise extraction of emitter characterization parameters could perhaps be achieved if the data were plotted as a so-called “Murphy-Good (MG) plot”. Unlike a Fowler-Nordheim plot, which is theoretically predicted to be slightly curved, a Murphy-Good plot is predicted to be “almost exactly” straight. This presentation gives relevant theoretical formulas, and reports a comparison between these two plot types, based on the use of simulated data. It is confirmed that a MG plot can be used to apply an orthodoxy test. And it is illustrated that a MG plot gives results for extracted characterization parameters that are more precise than those extracted from a FN plot.\",\"PeriodicalId\":292538,\"journal\":{\"name\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC49440.2020.9203392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC49440.2020.9203392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparing the performance of Fowler-Nordheim plots and Murphy-Good plots
Field electron emission studies normally use Fowler-Nordheim (FN) plots to analyze measured current-voltage characteristics. More precise extraction of emitter characterization parameters could perhaps be achieved if the data were plotted as a so-called “Murphy-Good (MG) plot”. Unlike a Fowler-Nordheim plot, which is theoretically predicted to be slightly curved, a Murphy-Good plot is predicted to be “almost exactly” straight. This presentation gives relevant theoretical formulas, and reports a comparison between these two plot types, based on the use of simulated data. It is confirmed that a MG plot can be used to apply an orthodoxy test. And it is illustrated that a MG plot gives results for extracted characterization parameters that are more precise than those extracted from a FN plot.