HFC(100)尖端在不同温度下的电子发射

T. Kusunoki, N. Arai
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引用次数: 0

摘要

我们研究了碳化铪:HfC(100)单晶尖端在不同温度下的发射特性,以寻找下一代扫描电子显微镜(sem)发射体的候选材料。发射方式从冷场发射(CFE)到热场发射(TFE),最后到肖特基发射(SE)。发射电子的能量宽度在CFE中为0.2 eV,在TFE中变大,在SE中又变小。除高温TFE外,发射电流噪声小,在电子枪中发射稳定性高。高单色性和稳定的电子发射是高分辨率sem的理想选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electron Emission from HFC(100) Tip at Various Temperatures
We investigated the emission characteristics of a hafnium carbide: HfC(100) single crystal tip at various temperatures toward finding a candidate of next-generation emitters for scanning electron microscopes (SEMs). The emission mode changed from cold field emission (CFE) to thermal field emission (TFE) and finally to Schottky emission (SE). The energy width of the emitted electrons was 0.2 eV in CFE, which became larger in TFE and then small again in SE. The emission current noise was small except for high temperature TFE, and the emission had high stability in electron gun of the SEMs. The high monochromaticity and stable electron emission are suitable for high-resolution SEMs.
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