{"title":"在含有表面活性剂的蚀刻溶液中进行化学抛光","authors":"R. J. Brandmayr, J. Vig","doi":"10.1109/FREQ.1985.200857","DOIUrl":null,"url":null,"abstract":"The feasibility of chemical polishing a wide variety of quartz cuts has been demonstrated PreviOUSly. Chemical polishing etchants have been identified for AT-, BT-, IT-, sc-, ST-, Z-cuts and others. It has also been found that, in order to attain a uniform polish with the various etchants, the surfaces must be extremely clean. Surface contaminants can act as etch resists. The etching of contaminated surfaces can result in a \"blotchy\" appearance. Elaborate and time-consuming cleaning procedures have been developed in order to ensure that the surfaces are uniformly polished. SC-cuts and Z-cuts are especially sensitive to surface contamination. It has been found that adding certain surfactants to the etching solution can make the chemical polishing process virtually foolproof. The cleaning action and increased wettability produced by the surfactants minimize the need for precleaning. A short and simple cleaning procedure is all that is needed to ensure a uniform polish. A commercially available premixed etching solution that contains a p r o p r i e t a r y surfactant has been found to consistently produce a uniform chemical polish on SCand AT-cut crystals after only a minimum of precleaning. Commercially available fluorochemical surfactants which the user can add to a variety of fluoride-type etchants, have also been found to produce uniformly polished surfaces on both AT-cut and SC-cut crystals. The results of the evaluation of various surfactants will be reported.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Chemical Polishing in Etching Solutions That Contain Surfactants\",\"authors\":\"R. J. Brandmayr, J. Vig\",\"doi\":\"10.1109/FREQ.1985.200857\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The feasibility of chemical polishing a wide variety of quartz cuts has been demonstrated PreviOUSly. Chemical polishing etchants have been identified for AT-, BT-, IT-, sc-, ST-, Z-cuts and others. It has also been found that, in order to attain a uniform polish with the various etchants, the surfaces must be extremely clean. Surface contaminants can act as etch resists. The etching of contaminated surfaces can result in a \\\"blotchy\\\" appearance. Elaborate and time-consuming cleaning procedures have been developed in order to ensure that the surfaces are uniformly polished. SC-cuts and Z-cuts are especially sensitive to surface contamination. It has been found that adding certain surfactants to the etching solution can make the chemical polishing process virtually foolproof. The cleaning action and increased wettability produced by the surfactants minimize the need for precleaning. A short and simple cleaning procedure is all that is needed to ensure a uniform polish. A commercially available premixed etching solution that contains a p r o p r i e t a r y surfactant has been found to consistently produce a uniform chemical polish on SCand AT-cut crystals after only a minimum of precleaning. Commercially available fluorochemical surfactants which the user can add to a variety of fluoride-type etchants, have also been found to produce uniformly polished surfaces on both AT-cut and SC-cut crystals. The results of the evaluation of various surfactants will be reported.\",\"PeriodicalId\":291824,\"journal\":{\"name\":\"39th Annual Symposium on Frequency Control\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"39th Annual Symposium on Frequency Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.1985.200857\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"39th Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1985.200857","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
摘要
化学抛光各种石英切割的可行性先前已被证明。化学抛光腐蚀剂已被确定用于AT-, BT-, IT-, sc-, ST-, z -等切割。还发现,为了用各种腐蚀剂获得均匀的抛光,表面必须非常干净。表面污染物可以起到抗蚀刻剂的作用。受污染表面的蚀刻可导致“斑点”外观。为了确保表面均匀抛光,制定了复杂而耗时的清洁程序。sc型切口和z型切口对表面污染特别敏感。人们发现,在蚀刻溶液中加入某些表面活性剂可以使化学抛光过程几乎万无一失。表面活性剂产生的清洁作用和增加的润湿性减少了预清洗的需要。一个简短而简单的清洁程序是所有需要确保均匀抛光。一种市售的预混蚀刻溶液,含有p或p或r的表面活性剂,只需要最少的预清洗,就能在scat切割晶体上产生均匀的化学抛光。市售的氟化学表面活性剂,用户可以添加到各种氟化物型蚀刻剂中,也被发现可以在at切割和sc切割晶体上产生均匀的抛光表面。本文将报道各种表面活性剂的评价结果。
Chemical Polishing in Etching Solutions That Contain Surfactants
The feasibility of chemical polishing a wide variety of quartz cuts has been demonstrated PreviOUSly. Chemical polishing etchants have been identified for AT-, BT-, IT-, sc-, ST-, Z-cuts and others. It has also been found that, in order to attain a uniform polish with the various etchants, the surfaces must be extremely clean. Surface contaminants can act as etch resists. The etching of contaminated surfaces can result in a "blotchy" appearance. Elaborate and time-consuming cleaning procedures have been developed in order to ensure that the surfaces are uniformly polished. SC-cuts and Z-cuts are especially sensitive to surface contamination. It has been found that adding certain surfactants to the etching solution can make the chemical polishing process virtually foolproof. The cleaning action and increased wettability produced by the surfactants minimize the need for precleaning. A short and simple cleaning procedure is all that is needed to ensure a uniform polish. A commercially available premixed etching solution that contains a p r o p r i e t a r y surfactant has been found to consistently produce a uniform chemical polish on SCand AT-cut crystals after only a minimum of precleaning. Commercially available fluorochemical surfactants which the user can add to a variety of fluoride-type etchants, have also been found to produce uniformly polished surfaces on both AT-cut and SC-cut crystals. The results of the evaluation of various surfactants will be reported.