EOS/ESD研讨会的历史

{"title":"EOS/ESD研讨会的历史","authors":"T. Oishi, O. J. Mcateer, Thomas S. Speakman, T. Maloney, D. Swenson, S. Voldman, G. Boselli","doi":"10.1109/eosesd.2004.5272576","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":396807,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"History of the EOS/ESD symposium\",\"authors\":\"T. Oishi, O. J. Mcateer, Thomas S. Speakman, T. Maloney, D. Swenson, S. Voldman, G. Boselli\",\"doi\":\"10.1109/eosesd.2004.5272576\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":396807,\"journal\":{\"name\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/eosesd.2004.5272576\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/eosesd.2004.5272576","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}