集成电路延迟测试的挑战

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Pub Date : 2009-10-07 DOI:10.1109/DFT.2009.53

D. Walker

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引用次数: 0

摘要

集成电路的延迟测试越来越注重检测微小的延迟缺陷，并提高与功能测试的相关性。在这次演讲中，我们将描述我们最近在工业设计方面的努力和成果。

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Challenges in Delay Testing of Integrated Circuits

Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and results on industrial designs.

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2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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