使用半模基片集成波导(SIW)结构的无芯片射频识别(RFID)阅读器的频率发生器演示

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Vijay Sharma, Mohammad Hashmi
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引用次数: 0

摘要

提出了一种基于正向耦合器原理的频率发生器。本设计针对高频应用,采用半模基板集成波导结构实现正向耦合器。因此,它实现了紧凑性,与衬底集成波导结构相比,大约需要一半的面积,并支持非横向电磁(TEM)功能。非tem环境提供了在sub-GHz频段和毫米波范围内使用无芯片射频识别阅读器的频率发生器的灵活性。在Rogers 3006衬底上对正耦谐振器和频率发生器进行了全波模拟和后续测量,验证了所提出的设计概念。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Frequency generator demonstration using half mode Substrate Integrated Waveguide (SIW) structures for chipless Radio Frequency Identification (RFID) reader

Frequency generator demonstration using half mode Substrate Integrated Waveguide (SIW) structures for chipless Radio Frequency Identification (RFID) reader

A frequency generator based on the forward coupler principle is proposed. The proposed design, intended for high-frequency applications, uses Half-Mode Substrate Integrated Waveguide structure to realise the forward coupler. It thus achieves compactness, requiring approximately half the area compared to Substrate Integrated Waveguide structures, and supports non Transverse Electromagnetic (TEM) functionality. The non-TEM environment provides the flexibility to use the frequency generator for chipless Radio Frequency Identification readers in the sub-GHz band and mm-wave range. Full-wave simulations and the subsequent measurements on a prototype developed on Rogers 3006 substrate performed for the forward coupler resonators and frequency generator validate the proposed design concept.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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