L. Lolis, M. Pelissier, C. Bernier, D. Dallet, J. Bégueret
{"title":"带通采样射频接收机系统设计","authors":"L. Lolis, M. Pelissier, C. Bernier, D. Dallet, J. Bégueret","doi":"10.1109/ICECS.2009.5410785","DOIUrl":null,"url":null,"abstract":"This paper presents a novel method for analyzing the analog specifications of bandpass sampling (BPS) receivers. The method guarantees fast convergence to the required performance and can be exploited to study the best configurations for a given constraint (eg. power, integration) using different noise degradation distributions. A wide-band system-level simulation tool which separately models each degradation source is developed to validate the method.","PeriodicalId":343974,"journal":{"name":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"System design of bandpass sampling RF receivers\",\"authors\":\"L. Lolis, M. Pelissier, C. Bernier, D. Dallet, J. Bégueret\",\"doi\":\"10.1109/ICECS.2009.5410785\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel method for analyzing the analog specifications of bandpass sampling (BPS) receivers. The method guarantees fast convergence to the required performance and can be exploited to study the best configurations for a given constraint (eg. power, integration) using different noise degradation distributions. A wide-band system-level simulation tool which separately models each degradation source is developed to validate the method.\",\"PeriodicalId\":343974,\"journal\":{\"name\":\"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2009.5410785\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2009.5410785","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a novel method for analyzing the analog specifications of bandpass sampling (BPS) receivers. The method guarantees fast convergence to the required performance and can be exploited to study the best configurations for a given constraint (eg. power, integration) using different noise degradation distributions. A wide-band system-level simulation tool which separately models each degradation source is developed to validate the method.