{"title":"LDMOS晶体管的短期和长期安全工作区域考虑","authors":"P. Hower, S. Pendharkar","doi":"10.1109/RELPHY.2005.1493145","DOIUrl":null,"url":null,"abstract":"Lateral DMOS transistors are widely used in mixed-signal IC circuit designs, particularly where power handling is important. This paper views the LDMOS from a power-handling perspective, considering both design and characterization aspects. The complex nature of the LDMOS safe operating area (SOA) can be dealt with by considering long-term and short-term operating conditions. Long-term conditions are covered by a hot carrier SOA, and short-term conditions are further sub-divided into electrical SOA and thermal SOA. Characterization examples of the various kinds of SOA are given.","PeriodicalId":320150,"journal":{"name":"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.","volume":"226 5","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"43","resultStr":"{\"title\":\"Short and long-term safe operating area considerations in LDMOS transistors\",\"authors\":\"P. Hower, S. Pendharkar\",\"doi\":\"10.1109/RELPHY.2005.1493145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Lateral DMOS transistors are widely used in mixed-signal IC circuit designs, particularly where power handling is important. This paper views the LDMOS from a power-handling perspective, considering both design and characterization aspects. The complex nature of the LDMOS safe operating area (SOA) can be dealt with by considering long-term and short-term operating conditions. Long-term conditions are covered by a hot carrier SOA, and short-term conditions are further sub-divided into electrical SOA and thermal SOA. Characterization examples of the various kinds of SOA are given.\",\"PeriodicalId\":320150,\"journal\":{\"name\":\"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.\",\"volume\":\"226 5\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-04-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"43\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RELPHY.2005.1493145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.2005.1493145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Short and long-term safe operating area considerations in LDMOS transistors
Lateral DMOS transistors are widely used in mixed-signal IC circuit designs, particularly where power handling is important. This paper views the LDMOS from a power-handling perspective, considering both design and characterization aspects. The complex nature of the LDMOS safe operating area (SOA) can be dealt with by considering long-term and short-term operating conditions. Long-term conditions are covered by a hot carrier SOA, and short-term conditions are further sub-divided into electrical SOA and thermal SOA. Characterization examples of the various kinds of SOA are given.