任意定向finfet中电子迁移率的各向异性

F. Gámiz, L. Donetti, N. Rodriguez
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引用次数: 14

摘要

我们使用蒙特卡罗模拟器模拟了不同表面(hkl)取向和通道方向的finfet中电子迁移率的行为和体积反转的影响。对于每个表面方向,还考虑了不同的通道方向。在(110)表面,电子迁移率随通道方向的各向异性很强:当通道在(110)/方向时,电子迁移率比在(110)/方向高50%,与(100)/方向的迁移率相似。这种各向异性行为在(100)或(111)表面取向中没有观察到。对硅厚度的研究还揭示了体积反转效应的一些有趣结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Anisotropy of electron mobility in arbitrarily oriented FinFETs
We simulated the behavior of electron mobility and the effect of volume inversion in FinFETs with different surface (hkl) orientations and channel directions, using a Monte Carlo simulator. For each surface orientation, different channel directions were also considered. In the case of the (110) surface, a strong anisotropy of electron mobility with channel direction was seen: when the channel was in the (110)/<001> direction, electron mobility was 50% higher than in (110)/<1-10>, and was similar to the mobility for a (100)/<001> direction. This anisotropic behavior with channel orientation was not observed in the (100)-or (111)-surface orientations. The study with silicon thickness also revealed some interesting consequences of the volume inversion effect.
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