用矢量网络分析仪在受控射频信道中验证毫米波信道测深仪的性能

IF 4.6 1区 计算机科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Jeanne T. Quimby;Dylan F. Williams;Kate A. Remley;Diogo Ribeiro;Ruoyu Sun;Jelena Senic
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引用次数: 3

摘要

一种新的参考性能比较验证技术比较了同一受控静态信道的${E}$波段信道测深仪(CS)和参考矢量网络分析仪(VNA)测量值。这种新技术减少了其他方法中存在的不准确假设的数量,从而对CS硬件和处理性能进行了更强的验证。该技术比较来自这些测量的CS和VNA导出的信道度量。使用机械开关,我们建立了一个可控的静态射频通道。VNA具有全面的不确定性分析,将系统和随机的不确定性传播到功率延迟剖面。该方法适用于具有可拆卸天线的毫米波CS硬件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Millimeter-Wave Channel-Sounder Performance Verification Using Vector Network Analyzer in a Controlled RF Channel

Millimeter-Wave Channel-Sounder Performance Verification Using Vector Network Analyzer in a Controlled RF Channel

Millimeter-Wave Channel-Sounder Performance Verification Using Vector Network Analyzer in a Controlled RF Channel

Millimeter-Wave Channel-Sounder Performance Verification Using Vector Network Analyzer in a Controlled RF Channel
A new comparison-to-reference performance verification technique compares an ${E}$ -band channel-sounder (CS) and reference vector network analyzer (VNA) measurements of the same controlled, static channel. This new technique reduces the number of inaccurate assumptions that exist in other methods providing a stronger verification of the CS hardware and processing performance. This technique compares the CS and VNA-derived channel metrics from these measurements. Using mechanical switches, we established a controlled, static RF channel. The VNA has a comprehensive uncertainty analysis that propagates systematic and random uncertainties through to the power delay profiles. The method is suitable for millimeter-wave CS hardware with removable antennas.
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来源期刊
CiteScore
10.40
自引率
28.10%
发文量
968
审稿时长
4.7 months
期刊介绍: IEEE Transactions on Antennas and Propagation includes theoretical and experimental advances in antennas, including design and development, and in the propagation of electromagnetic waves, including scattering, diffraction, and interaction with continuous media; and applications pertaining to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques
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