任意非均匀物体电磁场展开的新的数值基集

IF 4.6 1区 计算机科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Ioannis P. Georgakis;Jorge Fernández Villena;Athanasios G. Polimeridis;Riccardo Lattanzi
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引用次数: 2

摘要

我们研究了如何构造低阶子空间基集,以准确地表示惠更斯表面外的射频源在非均匀任意物体内产生的电磁场。基的生成依赖于格林函数积分微分算子的奇异值分解,这使得导出一个降阶但稳定的模型是可行的。我们详细研究了产生这种基础的理论和数值必要条件,并展示了如何使用它来计算磁共振成像应用中的性能极限。最后,我们提出了一个计算任意非均匀物体特征模态的新的数值框架。在均匀球形物体的情况下,我们验证了数值基础相对于完整分析基础的准确性和收敛性。我们表明,惠更斯表面的离散化对计算精度的影响最小,这主要取决于EM求解器的分辨率和近似阶数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel Numerical Basis Sets for Electromagnetic Field Expansion in Arbitrary Inhomogeneous Objects
We investigated how to construct low-order subspace basis sets to accurately represent electromagnetic (EM) fields generated within inhomogeneous arbitrary objects by radio frequency sources external to Huygen’s surface. The basis generation relies on the singular value decomposition of Green’s functions integrodifferential operators, which makes it feasible to derive a reduced-order yet stable model. We present a detailed study of the theoretical and numerical requisites for generating such basis and show how it can be used to calculate performance limits in magnetic resonance imaging applications. Finally, we propose a novel numerical framework for the computation of characteristic modes of arbitrary inhomogeneous objects. We validated accuracy and convergence properties of the numerical basis against a complete analytical basis in the case of a uniform spherical object. We showed that the discretization of Huygens’s surface has a minimal effect on the accuracy of the calculations, which mainly depends on the EM solver resolution and order of approximation.
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来源期刊
CiteScore
10.40
自引率
28.10%
发文量
968
审稿时长
4.7 months
期刊介绍: IEEE Transactions on Antennas and Propagation includes theoretical and experimental advances in antennas, including design and development, and in the propagation of electromagnetic waves, including scattering, diffraction, and interaction with continuous media; and applications pertaining to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques
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