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Journal of the Institute of Electronics Engineers of Korea最新文献

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Beam Selection with Joint Transmission for Millimeter-Wave Aerial Vehicles based on 3GPP 基于3GPP的毫米波飞行器联合传输波束选择
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.3
Sangmi Moon, Hyeonsu Kim, J. Kim, 김 대진, I. Hwang
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引用次数: 0
Avoiding Performance Degradation of DNN based Safety-Critical Applications in Autonomous Vehicles 自动驾驶汽车中基于深度神经网络的安全关键应用避免性能下降
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.56
Do-Young Kim, Myungsun Kim
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引用次数: 0
Deep Learning-based Bengali Handwritten Grapheme Classification for Kaggle Bengali.AI Challenge 基于深度学习的Kaggle孟加拉语手写字素分类。人工智能的挑战
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.67
Chaehyeon Lee, Jaehyeop Choi, Heechul Jung
{"title":"Deep Learning-based Bengali Handwritten Grapheme Classification for Kaggle Bengali.AI Challenge","authors":"Chaehyeon Lee, Jaehyeop Choi, Heechul Jung","doi":"10.5573/ieie.2020.57.9.67","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.9.67","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131297849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
NOR Flash를 위한 하프늄 옥사이드 기반 비휘발성 메모리 소자에서의 사파이어 기판을 통한 Self-heating Effect 및 Retention 개선 通过蓝宝石基板改善NOR Flash的自爆效应与反应
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.29
Young Suh Song, Hyun-Wook Kim
{"title":"NOR Flash를 위한 하프늄 옥사이드 기반 비휘발성 메모리 소자에서의 사파이어 기판을 통한 Self-heating Effect 및 Retention 개선","authors":"Young Suh Song, Hyun-Wook Kim","doi":"10.5573/ieie.2020.57.9.29","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.9.29","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"87 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120867105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Study on ESD Predictive Analysis Technology for System Level Defect Analysis of Rear Camera Module 后置摄像头模组系统级缺陷分析的ESD预测分析技术研究
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.19
Yanghyun Kim, C. Seo
{"title":"A Study on ESD Predictive Analysis Technology for System Level Defect Analysis of Rear Camera Module","authors":"Yanghyun Kim, C. Seo","doi":"10.5573/ieie.2020.57.9.19","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.9.19","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130923028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and Analysis of Cell Interaction-Based QCA Multiplexer Considering Scalability and Connectivity 考虑可扩展性和连通性的基于小区交互的QCA复用器设计与分析
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-09-30 DOI: 10.5573/ieie.2020.57.9.50
D. Seo, J. Jeon
{"title":"Design and Analysis of Cell Interaction-Based QCA Multiplexer Considering Scalability and Connectivity","authors":"D. Seo, J. Jeon","doi":"10.5573/ieie.2020.57.9.50","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.9.50","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"427 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126721246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Comparative Study of Explainable AI Techniques for Process Analysis 过程分析中可解释人工智能技术的比较研究
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-08-31 DOI: 10.5573/ieie.2020.57.8.51
Chanyil Jung, Hoojin Lee
{"title":"A Comparative Study of Explainable AI Techniques for Process Analysis","authors":"Chanyil Jung, Hoojin Lee","doi":"10.5573/ieie.2020.57.8.51","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.8.51","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130302830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Adjacent Satellite Interference Cancellation in Dual-contact Satellite Scenario 双接触卫星场景下相邻卫星干扰消除
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-08-31 DOI: 10.5573/ieie.2020.57.8.9
Hong-Won Park, Y. Jang
{"title":"Adjacent Satellite Interference Cancellation in Dual-contact Satellite Scenario","authors":"Hong-Won Park, Y. Jang","doi":"10.5573/ieie.2020.57.8.9","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.8.9","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120848136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Cuckoo Hashing with Three Hash Tables 布谷鸟哈希与三个哈希表
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-08-31 DOI: 10.5573/ieie.2020.57.8.91
Saeyoung Jang, Hayoung Byun, Hyesook Lim
{"title":"Cuckoo Hashing with Three Hash Tables","authors":"Saeyoung Jang, Hayoung Byun, Hyesook Lim","doi":"10.5573/ieie.2020.57.8.91","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.8.91","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134062243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Study on the Phase Response of Secondary Battery to Inductive Load 二次电池对感性负载的相位响应研究
Journal of the Institute of Electronics Engineers of Korea Pub Date : 2020-08-31 DOI: 10.5573/ieie.2020.57.8.63
Dae-soo Kang, Jeong-Bong You
{"title":"A Study on the Phase Response of Secondary Battery to Inductive Load","authors":"Dae-soo Kang, Jeong-Bong You","doi":"10.5573/ieie.2020.57.8.63","DOIUrl":"https://doi.org/10.5573/ieie.2020.57.8.63","url":null,"abstract":"","PeriodicalId":426821,"journal":{"name":"Journal of the Institute of Electronics Engineers of Korea","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122883687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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