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2009 32nd International Spring Seminar on Electronics Technology最新文献

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Modification of detection process on ZnO sensors by ultraviolet radiation 紫外辐射对氧化锌传感器检测工艺的改进
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207072
Jakub Napravnik, V. Myslík, M. Vrňata, F. Vysloužil, P. Fitl, Dušan Kopecký, J. Vlcek
{"title":"Modification of detection process on ZnO sensors by ultraviolet radiation","authors":"Jakub Napravnik, V. Myslík, M. Vrňata, F. Vysloužil, P. Fitl, Dušan Kopecký, J. Vlcek","doi":"10.1109/ISSE.2009.5207072","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207072","url":null,"abstract":"The contribution deals with influence of radiation in the near UV region (λ = 396 nm) on detection properties of conductive type gas sensors. The ZnO active layers of the sensors were deposited on Alumina substrates by Pulsed Laser Deposition method. Resulting thickness of active layers was ∼ 450 nm. The dc-sensitivity was evaluated from resistance change under exposition of hydrogen and acetone and toluene vapours in synthetic air. The sensitivity to acetone was doubled using the UV radiation at 250°C.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132565910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bladder cancer cell imaging system 膀胱癌细胞成像系统
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5206970
M. Weilguni, W. Smetana, M. Edetsberger, G. Kohler
{"title":"Bladder cancer cell imaging system","authors":"M. Weilguni, W. Smetana, M. Edetsberger, G. Kohler","doi":"10.1109/ISSE.2009.5206970","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5206970","url":null,"abstract":"A system for observing bladder cancer cells in form of a miniaturized fluorescence microscope has been developed. Attention has turned to integrate this system in an existing LTCC (Low Temperature Cofired Ceramics) module. Software with a region detecting algorithm has been written to automatically detect the captured images. The cancer specimen was marked with hypericin, which is selective on bladder cancer cells. After coloring the specimen was excited with green light of a high power LED. The red emitting hypericin marked cells were captured by a CMOS chip and evaluated with the software to confirm or negate a suspicion of cancer.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132689640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of Si interlayer on nickel and platinum ohmic contacts for N-type SiC Si中间层对n型SiC中镍和铂欧姆触点的影响
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207061
P. Machac, B. Barda
{"title":"Effects of Si interlayer on nickel and platinum ohmic contacts for N-type SiC","authors":"P. Machac, B. Barda","doi":"10.1109/ISSE.2009.5207061","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207061","url":null,"abstract":"Platinum and nickel contacts with and without silicon addition were prepared and compared on 4H and 6H silicon carbide. After deposition, samples were gradually annealed up to 1150°C. Si addition into Pt contact was beneficial for decreasing of contact resistivity on 4H-SiC, but on 6H-SiC the effect was negligible. In the case of Ni-based contacts, the influence of Si was more pronounced for samples on 6H-SiC substrate, but after annealing at temperatures higher than 850°C similar values of contact resistivity were achieved for contacts with different Ni-Si ratio on both 4H and 6H-SiC.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133368810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Solder paste shelf life extending approach for prototyping and small series activities 焊锡膏保质期延长方法的原型和小系列活动
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207037
I. Plotog, P. Svasta, T. Cucu, A. Vasile, A. Marin
{"title":"Solder paste shelf life extending approach for prototyping and small series activities","authors":"I. Plotog, P. Svasta, T. Cucu, A. Vasile, A. Marin","doi":"10.1109/ISSE.2009.5207037","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207037","url":null,"abstract":"In case of prototyping and small series it can be identified a common practical issue for EMS (Electronic Manufacturing Services) companies, especially in case of prototyping and small series activities, regarding solder paste loss percent, production costs and solder joints reliability consequences. Although the solder pastes producers assure minimum 8 hours stencil life-STL (the warranted solder pastes in printing period usage) for printing or dispensing in the recommended ambient conditions: temperature 22° to 28°C and 30%–70% relative humidity, and over six months shelf life-SHL (the shelf warranted storage period in the determined ambient conditions), the solder pastes loss percent goes over 20% in these cases. Process engineers allow to use solder pastes after SHL to and over STL limits [2], in order to reduce loses and implicit costs, taking (or not) into consideration possible solder joints reliability implications. Taking into consideration the solder pastes, as part of 4P Soldering Model for solder joints reliability analyze, in the paper will be presented the study done to find solution for prolonging SHL over producer data, maintaining their properties. The work will be used to develop acceptance methods for solder paste usage after SHL.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129307480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Improving the radiation properties of a piezoceramic air ultrasound transducer by adding a ceramic membrane 通过添加陶瓷膜改善压电空气超声换能器的辐射性能
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207067
R. Medek, J. Kellner, H. Schweinzer
{"title":"Improving the radiation properties of a piezoceramic air ultrasound transducer by adding a ceramic membrane","authors":"R. Medek, J. Kellner, H. Schweinzer","doi":"10.1109/ISSE.2009.5207067","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207067","url":null,"abstract":"Ultrasound systems based on piezoceramic transducers have the disadvantageous property of poor acoustical impedance matching to air leading to relative low ultrasound pressure output in spite of high driving voltages. In order to increase the output of the transducer a thin ceramic membrane (LTCC Low Temperature Cofired Ceramic) is mounted on the piezoceramic material. With the mounted membrane, the measured ultrasound pressure is more than three times as high as without the membrane at the same driving voltage. First results of this new type of transducer will be presented in this work.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121238353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The sputtered dielectric thin film layer and their properties 溅射介质薄膜层及其性能
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207055
I. Pelikánová, J. Cinert
{"title":"The sputtered dielectric thin film layer and their properties","authors":"I. Pelikánová, J. Cinert","doi":"10.1109/ISSE.2009.5207055","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207055","url":null,"abstract":"The work is focused on investigation of properties of thin film layer in dependence on deposition process. Dielectric AlN thin film layers were prepared by using of aluminum target and reactive sputtering. The capacitance, dielectric loss and thickness of thin film capacitors were analyzed. The properties of thin film dielectric layer during sputtering are influenced by power of plasma generator, partial pressure of reactive gas in sputtering chamber and time of sputtering. Thickness of dielectric layer is evaluated by using confocal microscope.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"3 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120977277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Virtual instrumentation platform for power electronics education 电力电子教学虚拟仪器平台
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5206947
G. Chindris, H. Hedesiu
{"title":"Virtual instrumentation platform for power electronics education","authors":"G. Chindris, H. Hedesiu","doi":"10.1109/ISSE.2009.5206947","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5206947","url":null,"abstract":"The advent of portable devices has a significant impact on the manufacturing industry. Remote programming, monitoring, diagnosis, debugging and configuration are now possible by using off-the-shelf PDAs or cellular phones. In a similar manner, education for certain fields of electronics will have to also move forward, to embrace new technologies not so obvious related with that fields. A new type of Virtual Instrument is described in this application note, one that is capable of using the latest advances in mobile computing and communication technologies to solve measurement and control applications. Mobile technologies are a new chapter of monitoring and testing industries. The paper presented the results of some educational projects, developed and oriented to graphical programming for small size nodes and distributed measurements nodes, applicable to MCM and power electronics.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121225304","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influences of sterilisation procedures on polymer surfaces 灭菌程序对聚合物表面的影响
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5206983
A. Wanke, A. Paproth, J. Uhlemann, K. Wolter
{"title":"Influences of sterilisation procedures on polymer surfaces","authors":"A. Wanke, A. Paproth, J. Uhlemann, K. Wolter","doi":"10.1109/ISSE.2009.5206983","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5206983","url":null,"abstract":"This paper describes the influences of different sterilisation procedures regarding to the behaviour of biocompatible packaging materials. The effects of these procedures on coated substances are researched, i.e. adhesive strength towards the substrate, surface energy and roughness. Non-sterilised, coated samples are used as references. Additionally studies of former samples are analysed to detect the influences of long exposure times, especially in relation to adhesion. The coatings are the polymers named the Poly-Para-Xylylen “Parylene C” and the silicone “Med 6-6606”. Glass is used as carrier. The applied sterilisation procedures are electron beam sterilisation, gamma radiation sterilisation and the influence of ethylene oxide.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127313080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Integrated LTCC chamber with optical ports and thermal control elements 集成LTCC室与光学端口和热控制元件
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207070
P. Bembnowicz, Dorota Nowakowska, L. Golonka
{"title":"Integrated LTCC chamber with optical ports and thermal control elements","authors":"P. Bembnowicz, Dorota Nowakowska, L. Golonka","doi":"10.1109/ISSE.2009.5207070","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207070","url":null,"abstract":"This document shows the microsystem, made of LTCC (Low Temperature Co-fired Ceramic) material, for biochemical and chemical applications. The structure consists of a chamber, a glass window, an inlet and an outlet, an optical waveguide, a heater and a temperature sensor. The novel LTCC-glass technology is used to build the ceramic microreactor. The additional glass elements enable real-time, optical analyses. The integrated heater and the temperature sensor allow reactor to achieve required temperature. FEA (Finite Element Analyze) is applied to optimize thermal properties of the designed chamber. Furthermore, the electronic control system is constructed in order to obtain proper temperature profile.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125802538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
HF comparative analysis of some LTCC technology materials by simulation methods 采用仿真方法对几种LTCC工艺材料进行HF对比分析
2009 32nd International Spring Seminar on Electronics Technology Pub Date : 2009-05-13 DOI: 10.1109/ISSE.2009.5207010
D. Ionescu, V. Cehan
{"title":"HF comparative analysis of some LTCC technology materials by simulation methods","authors":"D. Ionescu, V. Cehan","doi":"10.1109/ISSE.2009.5207010","DOIUrl":"https://doi.org/10.1109/ISSE.2009.5207010","url":null,"abstract":"Glass-ceramic products for the LTCC technologies were analyzed in this paper from the point of view of their dielectric properties at high frequencies. A frequency domain of 2.4 – 18 GHz was considered, in microwave range, and our results are coming to complete the results obtained until now at lower frequencies. A detailed structural simulation was performed with help of the High Frequency Structural Simulator (by Ansoft), considering the internal structure of each class of material sample. Samples structural particularities impose the character of the HF field interaction with the material. The polarization level, indicated by the electric effective permittivity value evolves with frequency and temperature in agreement of these interaction mechanisms. The parametrical evolution of the electric permittivity was illustrated on graphs in the specified frequency range and for the temperature domain of 27 – 200 °C, above the lamination temperature.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114569487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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