39th Annual Symposium on Frequency Control最新文献

{"title":"Etch Processing of Bulk and Surface Wave Devices","authors":"J. Dowsett, D.F.G. Dwyer, F. Stern, R. Heinecke, A. Truelove","doi":"10.1109/FREQ.1985.200860","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200860","url":null,"abstract":"Etch processing of bulk wave devices is a developing technique where the upper frequency limitation of the mechanical processes can no longer be applied. However, the use of chemical or plasma processes imposes other disciplines with regard to the quality of the material and to the mechanical processes preceding the final etch. This paper discusses the techniques and the results achieved in the manufacture of bulk wa-!e resonators up to l50 MHz in the fundamental mode using the AT-cut.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129314659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Mechanical Couplings Involving Discontinuities of the Frequency-Temperature Curves of Contoured Quartz Resonators","authors":"R. Bourquin, B. Dulmet, G. Genestier","doi":"10.1109/FREQ.1985.200878","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200878","url":null,"abstract":"In this paper, frequency jumps occuring in the frequency temperature curves of contoured resonators are studied. Besides vibration trapping effect, contouring the plate involves some mechanical couplings which may be strongly dependent on temperature. This will occur whenever two or several coupled modes are very close in frequency, while exhibiting different therrral sensitivities. Because contouring generates anharmonic modes in large frequency range, such an event frequently occurs. We have investigated some examples of such couplings in an AT-cut resonator vibrating in slow shear C-mode (seventh overtone) coupled with fast shear B-mode (sixth overtone). Each coupling is very strong in a range of a few degrees. Our theoretical analysis is built on Green's 5ormalism : the mode pattern of the actual vibration is assumed to be a rnlxing of simple mode patterns. Jumps of the frequency temperature curves are induced by the thermal dependency of this mixing. Use of separated X-Rays topographs for the components of the mechanical displacement enables us to verify the predicted mode patterns at various temperatures.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132375236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Simple Thickness Plate Modes Driven by Lateral Fields","authors":"A. Ballato, E. R. Hatch, M. Mizan, T. Lukaszek, E. R. Tilton","doi":"10.1109/FREQ.1985.200885","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200885","url":null,"abstract":"","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"26 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114001805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Rubidium Clock Model","authors":"R. Frueholz, J. Camparo","doi":"10.1109/FREQ.1985.200815","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200815","url":null,"abstract":"Abstract : This report develops a signal model for the rubidium (Rb) clock. This model combines feedback anlaysis of the clock's servo-control circuitry with the atomic physics required to describe the processes occurring within the Rb absorption cell. The model permits clock performance, in terms of Allan variance, to be predicted from a number of electronic and physical parameters. While building on prior studies of Rb standards, the model incorporates a number of features which make it distinctive. All previous models of the Rb clock were limited to an analysis of the clock's short term performance, Allan variance averaging times of less than 10,000 sec. However, by explicitly including the effects of discharge lamp intensity fluctuations, which are transformed into output frequency variations via the light shift effect, clock performance can be predicted for averaging times greater than 10,000 sec. Furthermore, the model is the first which incorporates the influence of an optically thick Rb vapor along with the diffusion of optically pumped atoms to the walls of the absorption cell into the calculation of clock performance. In addition, the model has been developed in sufficient generality to permit its application to diode laser pumped clocks using other alkali metals.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122473734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Frequency Stability Characterization from the Filtered Signal of a Precision Oscillator","authors":"P. Tremblay, M. Tetu","doi":"10.1109/FREQ.1985.200829","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200829","url":null,"abstract":"This paper presents the evaluation of the frequency stability characterization of an oscillator when its signal is directly filtered instead of its phase as is usually considered in the development of the standard theory. The amplitude and the phase fluctuations of the filtered signal are expressed as functions of filter impulse response and input signals characteristics. The general expressions for the power spectral density of the amplitude and phase fluctuations of the filtered signal are then calculated. The results obtained for the phase fluctuations of the filtered signal are used to characterize the frequency stability of the oscillator. Every filter will have a particular effect on the measured phase fluctuations and we study some commonly used filters. For each filter, we give the contribution of white additive noise to the Allan variance and to the modified Allan variance (white phase noise). An experimental verification for the Allan variance in presence of additive noise shows an excellent agreement with the theoretical predictions. Introduction Barnes et al. [l], in their paper entitled \"Characterization of Frequency Stability\", have brought the major policies guiding the field of frequency stability measurement for about twenty-five years. Among other things, they wrote about time domain frequency stability measurement: \"Good practice, however, dictates that the system noise bandwidth fh should be specified with any results.\" Until now no means were provided to help the xperimentalist performing such a measurement o evaluate this bandwidth. One was obliged to suppose a rectangular low-pass [ 2 ] , [ 3 ] or a first-order low-pass [4]-[61 phase filtering in order to specify the experimental conditions and to fully characterize the oscillator under test. These two types of phase filtering are different from most of the experimental setups used to measure the frequency stability. This work presents an evaluation of the effects encountered in frequency stability characterization when a filter is directly applied to the signal of a precision oscillator. We consider the case where the oscillator signal is perturbed by internal noise and by additive noise and where the resulting signal is passed through a linear filter. The amplitude and the phase fluctuations of the filtered signal are expressed as functions of filter impulse response and input signals characteristics. The general expressions for the power spectral density of the amplitude and phase fluctuations of the filtered signal are then calculated. A preliminary version of this work has been presented to the 1984 CPEM in Del:t, The Netherlands [ 7 ] . The results obtained for the p ase fluctuations of the filtered signal are used to characterize the frequency stability of the oscillator. This characterization is done either in the frequency domain by a power spectral density measurement or in the time domain by a variance measurement. A given filter will have a particular effect on ","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128315645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A System for Precision Parameter Measurements on Quartz Crystal Resonators and Bipoles","authors":"R. Peach, S. E. Morris","doi":"10.1109/FREQ.1985.200894","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200894","url":null,"abstract":"","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"170 1-2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116637214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Etching Study of AT-Cut Cultured Quartz Using Etchants Containing Fluoride Salts, Hydrofluoric Acid, and Ammonium Bifluorlde","authors":"A. Bernot","doi":"10.1109/FREQ.1985.200856","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200856","url":null,"abstract":"T h i s p a p e r r e p o r t s t h e r e s u l t s o f a chemical e t c h i n g s t u d y o f A T c u t c u l t u r e d q u a r t z when t h e e t c h a n t s h y d r o f l u o r i c a c i d and amnonium b i f l u o r i d e a r e m o d i f i e d w i t h f l u o r i d e s a l t a d d i t i v e s . These f l u o r i d e s a l t s s u p p l y p o s i t i v e i o n s o t h e r t h a n H+ and NH3+ a t a d s o r p t i o n s i t e s on t h e q u a r t z s u r f a c e . R e s u l t s show t h a t s p e c i f i c f l u o r i d e s a l t s a f f e c t sur face topography and e tch de fec ts . The a d d i t i o n o f ca l c ium, a lum inum, and l i t h ium f l uo r ide reduce e tch p i t s and improve surface topography when added t o h y d r o f l u o r i c e t c h a n t s a t 60°C. A d d i t i o n o f p o t a s s i u m f l u o r i d e r e d u c e s e t c h p i t and e tch channe l f o rma t ion wnen added t o h y d r o f l u o r i c a c i d o r ammonium b i f l u o r i d e e t c h a n t s a t 25°C o r 60°C.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121935963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Phase Noise in Crystal Filters","authors":"R. Smythe","doi":"10.1109/FREQ.1985.200833","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200833","url":null,"abstract":"","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"139 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124046221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Processing of a Five Resonator VHF Crystal Device","authors":"C. W. Shanley, L. Dworsky, Jeffery A. Whalin, G. Clifford, Michael Nicholsen Scansaroli","doi":"10.1109/FREQ.1985.200871","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200871","url":null,"abstract":"","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116288891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Chemical Polishing in Etching Solutions That Contain Surfactants","authors":"R. J. Brandmayr, J. Vig","doi":"10.1109/FREQ.1985.200857","DOIUrl":"https://doi.org/10.1109/FREQ.1985.200857","url":null,"abstract":"The feasibility of chemical polishing a wide variety of quartz cuts has been demonstrated PreviOUSly. Chemical polishing etchants have been identified for AT-, BT-, IT-, sc-, ST-, Z-cuts and others. It has also been found that, in order to attain a uniform polish with the various etchants, the surfaces must be extremely clean. Surface contaminants can act as etch resists. The etching of contaminated surfaces can result in a \"blotchy\" appearance. Elaborate and time-consuming cleaning procedures have been developed in order to ensure that the surfaces are uniformly polished. SC-cuts and Z-cuts are especially sensitive to surface contamination. It has been found that adding certain surfactants to the etching solution can make the chemical polishing process virtually foolproof. The cleaning action and increased wettability produced by the surfactants minimize the need for precleaning. A short and simple cleaning procedure is all that is needed to ensure a uniform polish. A commercially available premixed etching solution that contains a p r o p r i e t a r y surfactant has been found to consistently produce a uniform chemical polish on SCand AT-cut crystals after only a minimum of precleaning. Commercially available fluorochemical surfactants which the user can add to a variety of fluoride-type etchants, have also been found to produce uniformly polished surfaces on both AT-cut and SC-cut crystals. The results of the evaluation of various surfactants will be reported.","PeriodicalId":291824,"journal":{"name":"39th Annual Symposium on Frequency Control","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114882836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}