{"title":"Residual Life Estimation of Humidity Sensor DHT11 Using Artificial Neural Networks","authors":"P. Sharma, C. Bhargava","doi":"10.4018/978-1-7998-1464-1.ch005","DOIUrl":"https://doi.org/10.4018/978-1-7998-1464-1.ch005","url":null,"abstract":"Electronic systems have become an integral part of our daily lives. From toy to radar, system is dependent on electronics. The health conditions of humidity sensor need to be monitored regularly. Temperature can be taken as a quality parameter for electronics systems, which work under variable conditions. Using various environmental testing techniques, the performance of DHT11 has been analysed. The failure of humidity sensor has been detected using accelerated life testing, and an expert system is modelled using various artificial intelligence techniques (i.e., Artificial Neural Network, Fuzzy Inference System, and Adaptive Neuro-Fuzzy Inference System). A comparison has been made between the response of actual and prediction techniques, which enable us to choose the best technique on the basis of minimum error and maximum accuracy. ANFIS is proven to be the best technique with minimum error for developing intelligent models.","PeriodicalId":282208,"journal":{"name":"AI Techniques for Reliability Prediction for Electronic Components","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126813571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability Analysis","authors":"C. Bhargava","doi":"10.4018/978-1-7998-1464-1.ch001","DOIUrl":"https://doi.org/10.4018/978-1-7998-1464-1.ch001","url":null,"abstract":"As the integration of components are increasing from VLSI to ULSI level. This may lead to damage of electronic system because each component has its own operating characteristics and conditions. So, health prognostic techniques are used that comprise a deep insight into failure cause and effects of all the components individually as well as an integrated technique. It will raise alarm, in case health condition, of the components drift from the desired outcomes. From toy to satellite and sand to silicon, the major key constraint of designing and manufacturing industry are towards enhanced operating performance at less operating time. As the technology advances towards high-speed and low-cost gadgets, reliability becomes a challenging issue.","PeriodicalId":282208,"journal":{"name":"AI Techniques for Reliability Prediction for Electronic Components","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114769677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}