Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.最新文献

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Interaction of redistribution traces with on-wafer interconnects in memory chip packaging 存储芯片封装中再分布轨迹与晶圆上互连的相互作用
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500936
M. Gospodinova, M.F. Ktata, J. Koellermeyer, G. Nan, M. Vogl, J. Thomas
{"title":"Interaction of redistribution traces with on-wafer interconnects in memory chip packaging","authors":"M. Gospodinova, M.F. Ktata, J. Koellermeyer, G. Nan, M. Vogl, J. Thomas","doi":"10.1109/SPI.2005.1500936","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500936","url":null,"abstract":"In this paper, we investigate the interaction between redistribution traces and on-chip interconnects in memory chip packages. The electromagnetic interaction is shown both in the frequency and in the time domain. In addition the impact of this interaction on the performance of memory component(s) is explored.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127616139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A CMOS compatible process for improved RF performance on highly doped substrates 一种在高掺杂基板上改善射频性能的CMOS兼容工艺
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500935
L. Fernández, U. Arz, D. Schubert, E. Berenschot, R. Wiegerink, J. Flokstra
{"title":"A CMOS compatible process for improved RF performance on highly doped substrates","authors":"L. Fernández, U. Arz, D. Schubert, E. Berenschot, R. Wiegerink, J. Flokstra","doi":"10.1109/SPI.2005.1500935","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500935","url":null,"abstract":"In this paper we present a CMOS compatible process for CMOS-grade wafers in order to create specific areas where radio frequency (RF) devices can be implemented without the high losses associated to this substrate. The process is based on refilling of deep trenches, which allows the local replacement of the silicon substrate by silicon nitride, which has very good RF properties (tan /spl delta/ = 5-9 10/sup -4/). The trenches are in the order of 30 /spl mu/m deep and 2 /spl mu/m wide, leaving a space of 2 /spl mu/m in between where the silicon still remains. In this way, half of the lossy substrate is replaced by silicon nitride. We present measurement results which indicate that the RF performance of CMOS-grade wafers can be significantly improved, as well as a careful study of the most relevant fabrication parameters and the consequences for the final RF performance of the substrate. An additional advantage of this new technique is the possibility of using it as a pre-CMOS process, thus allowing monolithic integration of CMOS electronics and RF and microwave components.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133599505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electromagnetic interference self-learning toolkit in switched-mode power supplies 开关电源电磁干扰自学工具包
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500947
W. Khan-ngern, V. Tarateeraseth, J. Arthitthang, Jakgree Wongmuang, Therasak Sompanchen, Werachat, Wittaya Tasri
{"title":"Electromagnetic interference self-learning toolkit in switched-mode power supplies","authors":"W. Khan-ngern, V. Tarateeraseth, J. Arthitthang, Jakgree Wongmuang, Therasak Sompanchen, Werachat, Wittaya Tasri","doi":"10.1109/SPI.2005.1500947","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500947","url":null,"abstract":"This paper presents a simplified conducted EMI toolkit based on the basic circuits and concepts of power electronics. The simplified results of the EMI toolkit is to introduce the effect of conducted EMI caused by self-resonant frequency (SRF) of the passive components, reverse recovery time of diodes, switching frequencies, gate drive control, snubber circuit, parasitic capacitor of heat sink, EMI filtering, total harmonic distortion (THD) and conducted EMI. Those basic phenomena can lead designing engineers and students to understand the EMC concept, focused on only conducted emission, using step-by-step of the experiment.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133920186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Model-order reduction of VLSI circuit interconnects via a Laguerre representation 通过拉盖尔表示的VLSI电路互连的模型阶数降低
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500914
M. Telescu, N. Tanguy, P. Bréhonnet, P. Vilbé, Léon-Claude, Calvez, Fabrice Huret
{"title":"Model-order reduction of VLSI circuit interconnects via a Laguerre representation","authors":"M. Telescu, N. Tanguy, P. Bréhonnet, P. Vilbé, Léon-Claude, Calvez, Fabrice Huret","doi":"10.1109/SPI.2005.1500914","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500914","url":null,"abstract":"The VLSI (very large scale integration) industry has the tendency to decrease circuit size, increase speed, assuring ever lower energy consumption and ever higher integration density of analogical components accompanied by digital blocks. With this tendency circuit designers are faced with a new challenge: the analysis and modeling of logical and analogical signals propagating between two circuit points. The search for high speed applications makes the effects of interconnects, usually neglected in the past, an important issue; noise, delay, distortion, reflections and cross talk are just some of these effects. High integration density, miniaturization, high working frequencies are three great factors which prevent interconnects to be considered small independent circuits. Thus, simulation becomes a rather difficult task. Still, wouldn't it be possible to replace complete interconnect equivalent circuits by simpler and more flexible models. Our new model-order reduction technique is mainly based on the use of the Laguerre representation and a simple operator used to generate an approximation base.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117118134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Impact of on-die decoupling on the core and IO supplies of high performance microprocessors 芯片上解耦对高性能微处理器内核和IO供应的影响
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500887
T. Rahal-Arabi, G. Ji, G. Taylor
{"title":"Impact of on-die decoupling on the core and IO supplies of high performance microprocessors","authors":"T. Rahal-Arabi, G. Ji, G. Taylor","doi":"10.1109/SPI.2005.1500887","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500887","url":null,"abstract":"In this paper, we present an empirical validation of the power supply decoupling with particular emphasis on on-die capacitance. We investigate the effect of the decoupling on both the core and IO performance. The validation approach consists of building several silicon wafers of high performance processors with various amounts of decoupling. Extensive measurements are then done at the silicon, package, and system levels. Finally we offer some theoretical insights to explain the unexpected behavior.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"123 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121133921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 3D miniaturization method for low impedance designs 低阻抗设计的三维小型化方法
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500902
S.R. Banerjee, R. F. Drayton
{"title":"A 3D miniaturization method for low impedance designs","authors":"S.R. Banerjee, R. F. Drayton","doi":"10.1109/SPI.2005.1500902","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500902","url":null,"abstract":"Microstrip interconnects with a V conductor are designed, fabricated, and measured to provide a compact solution for designs requiring low characteristic impedance lines. S-parameter curves are shown up to 35 GHz for 0.5 cm long designs. The 308 /spl mu/m deep V structure produces a 33.8 /spl Omega/ line with strong standing waves and reflections under 5 dB. To further reduce the impedance, a partial shield is added that results in 6.7 times reduction of signal line width, near elimination of open end effect, and excellent correlation with a standard 15 /spl Omega/ microstrip up to 25 GHz. A filter demonstration shows near ideal behavior in 3 dB response and low return loss when compared to a similar design.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"539 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123114503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
3D frequency-dependent RLC elements extraction by full wave analysis: identification of the return current paths in complex power and ground grids of high speed VLSI circuits 基于全波分析的三维频率相关RLC元件提取:高速VLSI电路复杂电源和接地网中返回电流路径的识别
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500929
Y. Quéré, T. Le Gouguec, P. Martin, D. Le Berre, F. Huret, L. David, C. Cregut
{"title":"3D frequency-dependent RLC elements extraction by full wave analysis: identification of the return current paths in complex power and ground grids of high speed VLSI circuits","authors":"Y. Quéré, T. Le Gouguec, P. Martin, D. Le Berre, F. Huret, L. David, C. Cregut","doi":"10.1109/SPI.2005.1500929","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500929","url":null,"abstract":"This communication deals with the extraction and simulation of on-chip RLC per unit length (p.u.l.) elements for an efficient analysis of high speed digital circuits. In this context, the current distribution in the whole circuit, power and ground grids included, has to be known to correctly estimate inductance. By using a 3D full-wave finite elements method, we identified the current paths arising in the power and ground grids when an on-chip signal switches on a wire placed in a metal below the grids.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130817816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Computation of signal-threshold crossing times 信号阈值穿越次数的计算
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500937
A. Ligocka, W. Bandurski
{"title":"Computation of signal-threshold crossing times","authors":"A. Ligocka, W. Bandurski","doi":"10.1109/SPI.2005.1500937","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500937","url":null,"abstract":"In the paper we present our research with estimation of crossing time of the step response-threshold. The main idea of the presented approach is to use the exact expression for admittance matrix in time domain and to find the best initial value for optimization function.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132833661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rational modeling of spectral data using orthonormal vector fitting 利用正交矢量拟合对光谱数据进行合理建模
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500915
D. Deschrijver, T. Dhaene
{"title":"Rational modeling of spectral data using orthonormal vector fitting","authors":"D. Deschrijver, T. Dhaene","doi":"10.1109/SPI.2005.1500915","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500915","url":null,"abstract":"Vector fitting (VF) is an iterative rational macromodeling technique by B. Gustavsen and A. Semlyen (1999) that became quite popular over the last years, due to its simplicity and availability. Although the VF method provides accurate broadband macromodels, the numerical stability of the algorithm is not always optimal. In this paper, the orthonormal vector fitting (OVF) algorithm is introduced, which reduces the numerical sensitivity of the model parameterization to the choice of starting poles significantly, and limits the number of required iterations.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116772958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 42
Part II. Experiments. Signal propagation without distortion on lossy transmission lines having frequency dependent parameters 第二部分。实验。在具有频率相关参数的有损耗传输线上无失真的信号传播
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Pub Date : 2005-05-10 DOI: 10.1109/SPI.2005.1500894
R. Flake, J. Biskup
{"title":"Part II. Experiments. Signal propagation without distortion on lossy transmission lines having frequency dependent parameters","authors":"R. Flake, J. Biskup","doi":"10.1109/SPI.2005.1500894","DOIUrl":"https://doi.org/10.1109/SPI.2005.1500894","url":null,"abstract":"Experimental measurements illustrating some of the special propagation properties of the non-sinusoidal SD signal on cable are discussed in this paper. A companion paper (Part I) in this workshop outlined the theoretical foundations of these properties of the SD signal. First, the non-dispersive propagation nature of the speedy delivery waveform traveling with constant velocity is demonstrated experimentally on long lossy telephone (POTS) lines with frequency dependent parameters. The ability to control velocity (or 1/velocity = propagation delay/unit length traveled) of the SD signal by changing its shape parameter is demonstrated with measurements on a coaxial cable.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128800565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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