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X-Ray Nanoimaging: Instruments and Methods IV最新文献

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Front Matter: Volume 11112 封面:第11112卷
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-10-17 DOI: 10.1117/12.2552072
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引用次数: 0
The design of a transmission tender x-ray microscope at Taiwan Photon Source (Conference Presentation) 台湾光子源透射式x射线显微镜的设计(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2531167
G. Yin, Bo-Yi Chen, M. Hsu, Chien-yu Lee, Huang-Yeh Chen, C. Liao, Yi-Jr Su, Yu-Shan Huang, L. Lai
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引用次数: 0
New advances at CSX beamline in magnetic imaging (Conference Presentation) CSX波束线在磁成像中的新进展(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2528058
Wen Hu, C. Mazzoli, S. Wilkins
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引用次数: 1
High-resolution nano-imaging with transmission nanofocus x-ray source (Conference Presentation) 采用透射式纳米聚焦x射线源的高分辨率纳米成像技术(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2528469
A. Adibhatla, T. Tuohimaa, Fei Yang
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引用次数: 0
High-resolution ptychoraphic imaging of large-scale integrated circuits (Conference Presentation) 大规模集成电路的高分辨率平面成像(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2527505
Yi Jiang, Junjing Deng, J. Klug, Yudong Yao, C. Preissner, C. Roehrig, Z. Cai, B. Lai, S. Vogt
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引用次数: 0
Single exposure for double-sided zone plate optics for soft and hard x-ray imaging (Conference Presentation) 用于软硬x射线成像的双面带板光学单次曝光(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2530590
R. Peters, C. Fella, D. Müller, Mansi Shukla, Remko van den Hurk, M. Aktary
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引用次数: 0
Development of high-resolution full-field x-ray microscope based on multilayer advanced Kirkpatrick-Baez mirrors (Conference Presentation) 基于多层先进Kirkpatrick-Baez反射镜的高分辨率全视野x射线显微镜的研制(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2528366
S. Matsuyama, J. Yamada, T. Hagiwara, K. Omote, Raita Hirose, Y. Takeda, Y. Kohmura, M. Yabashi, T. Ishikawa, K. Yamauchi
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引用次数: 0
XUV coherence tomography: a novel approach to nanoscale 3D imaging (Conference Presentation) XUV相干层析成像:纳米级三维成像的新方法(会议报告)
X-Ray Nanoimaging: Instruments and Methods IV Pub Date : 2019-09-09 DOI: 10.1117/12.2528684
M. Wünsche, S. Fuchs, J. Nathanael, J. Abel, J. Reinhard, F. Wiesner, S. Skruszewicz, C. Rödel, G. Paulus
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引用次数: 0
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