Technical Program Committee

2007 IEEE International Test Conference Pub Date : 2020-10-01 DOI:10.1109/ITC.2004.172

C. C. Wit, A. Abate, Pedro Aguilar, Liguo Zhang, Amir Abbaszadeh, Masoud Aguilar Bustos, Luis Tupak, Ahmed, Qadeer Ahmed-Ali, Tarek Ajorlou, Amir Al Janaideh

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Abstract

Mikio Aoyama (Nanzan University) Doo-Hwan Bae (Korea Advanced Institute of Science and Technology) Ricky W.K. Chan (The University of Hong Kong) Dickson K.W. Chiu (Dickson Computer Systems) Dimitra Giannakopoulou (NASA) Paul Grefen (Eindhoven University of Technology) Yanbo Han (Institute of Computing Technology, CAS) Patrick Hung (University of Ontario Institute of Technology) Zhi Jin (Academy of Mathematics and Systems Science, CAS) Ryszard Kowalczyk (Swinburne University of Technology) Bernd Kraemer (Fern University) Shonali Krishnaswamy (Monash University) Francis C.M. Lau (The University of Hong Kong) Minglu Li (Shanghai Jiao Tong University) Chengfei Liu (Swinburne University of Technology) Hong Mei (Peking University) Balasubramaniam Ramesh (Georgia State University) Andreas Ulrich (Siemens) Zhiwei Xu (Institute of Computing Technology, CAS) (Eric Wong (University of Texas, Dallas) Zhaohui Wu (Zhejiang University) Jian Yang (Macquarie University) Y.T. Yu (City University of Hong Kong) Liang-Jie Zhang (IBM T.J. Watson Research Center) Yanchun Zhang (Victoria University of Technology) Hong Zhu (University of Oxford Brookes) CALL FOR PAPERS

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技术计划委员会

Mikio Aoyama(南山大学)Doo-Hwan Bae(韩国科学技术院)Ricky W.K. Chan(香港大学)Dickson K.W. Chiu(迪信计算机系统)Dimitra Giannakopoulou(美国国家航空航天局)Paul Grefen(埃因霍温理工大学)Yanbo Han(中国科学院计算技术研究所)Patrick Hung(加拿大安大略省理工大学)Zhi Jin(中国科学院数学与系统科学研究院)中科院Ryszard Kowalczyk (Swinburne University) Bernd Kraemer (Fern University) Shonali Krishnaswamy (Monash University) Francis C.M. Lau(香港大学)李明路(上海交通大学)刘成飞(Swinburne University) Mei Hong(北京大学)Balasubramaniam Ramesh (Georgia State University) Andreas Ulrich (Siemens)徐志伟(中科院计算技术研究所)Eric Wong(德克萨斯大学，达拉斯)吴朝晖(浙江大学)杨健(麦考瑞大学)余彦涛(香港城市大学)张良杰(IBM T.J. Watson研究中心)张彦春(维多利亚理工大学)朱红(牛津布鲁克斯大学

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2007 IEEE International Test Conference

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