Ni3Si2 nanowires for efficient electron field emission and limitations of the Fowler–Nordheim model

IF 1.4 4区 工程技术
A. Belkadi, Emma Zeng, A. Isakovic
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引用次数: 0

Abstract

The paper reports on top-down nanofabricated Ni3Si2 nanowires and tests of their electron field emission capabilities. The results include low turn on electric field, EON, moderate work function, , and the field enhancement factor,  customizable through nanofabrication. The paper also reports on the issues ahead in the field of nanowires-based electron mission, as there are quantitative limitations of the applicability of the FowlerNordheim model, which will become increasingly apparent as we continue to optimize field emission of electrons. To this end, we suggest adding the studies of surface-to-volume ratio effects of the nanowires as another standard for comparison, in order to lead to the input form of the density of states as quantum effects becoming more prominent. a) Electronic mail: aisakovic@colgate.edu and iregx137@gmail.com
用于高效电子场发射的Ni3Si2纳米线及Fowler-Nordheim模型的局限性
本文报道了自顶向下纳米化制备的Ni3Si2纳米线及其电子场发射能力的测试。结果包括低开度电场,EON,中等工作功能,和场增强因子,可通过纳米加工进行定制。本文还报告了基于纳米线的电子任务领域的未来问题,因为fowler - nordheim模型的适用性存在定量限制,随着我们继续优化电子的场发射,这将变得越来越明显。为此,我们建议增加纳米线的表面体积比效应的研究作为另一个比较标准,以导致态密度作为量子效应的输入形式变得更加突出。a)电子邮件:aisakovic@colgate.edu和iregx137@gmail.com
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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