An Improved SPICE Based Behavior Model for Non-Snapback TVS Devices with Ultra-low Turn-on Resistance

Abstract

TVS devices have been widely used in portable devices to improve the ESD robustness in system level ESD test. TVS model with good accuracy is desirable in the system level ESD simulation. This paper presents an improved SPICE based behavior model for TVS with ultra-low turn-on resistance. Validation have been down for both quasi-static behavior and transient behavior.