Impact of dislocation cell elastic strain variations on line profiles from deformed copper.

Abstract

Energy scanned, sub-micrometer X-ray beams were used to obtain diffraction line profiles from individual dislocation cells in copper single crystals deformed in compression. Sub-micrometer depth resolution was provided by translating a wire through the diffracted beams and using triangulation to determine the depths of the diffracting volumes. Connection to classic volume-averaged results was made by adding the line profiles from 52 spatially resolved dislocation cell measurements. The resulting sub profile is smooth and symmetric, in agreement with early assumptions; the mean strain and full width half maximum are consistent with the average of the parameters extracted from the more exact individual dislocation cell measurements.