Nonlinear absorption of InN epitaxial films probed by femtosecond pulsed transmission Z-scan measurements

2009 Conference on Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics Pub Date : 2009-10-30 DOI:10.1109/CLEOPR.2009.5292609

T. Tsai, Tsung-han Wu, Jung-cheng Liao, T. Wei, H. Chiang, Jih-shang Hwang, D. Tsai, Yang-fang Chen

引用次数: 0

Abstract

Nonlinear optical absorption of InN epitaxial films in the range of 720-790 nm were investigated by Z-scan measurements. The optical absorption cross-sections of the InN films were estimated, and the values are found in good agreement with band-filling model.

查看原文本刊更多论文

用飞秒脉冲透射z扫描测量InN外延膜的非线性吸收

采用z -扫描方法研究了720 ~ 790nm范围内InN外延膜的非线性光吸收。计算了InN薄膜的光学吸收截面，结果与带填充模型吻合较好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2009 Conference on Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics

自引率

0.00%

发文量