An estimated method for software testability measurement

软件 Pub Date : 1997-07-14 DOI:10.1109/STEP.1997.615470

Jin-Cherng Lin, Szu-Wen Lin, Ian-Ho

引用次数: 13

Abstract

Software testability is becoming an important factor to be considered during software development and assessment, especially for critical software. The paper gives software testability, previously defined by Voas (1991, 1992), a new model and measurement which is done before random black-box testing with respect to a particular input distribution. The authors also compared their measurement results with the one simulated according with Voas's model. It showed that their rough testability estimate provides enough information and will be used as guidelines for software development.

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一种软件可测试性度量的估计方法

软件的可测试性正在成为软件开发和评估过程中需要考虑的一个重要因素，尤其是对于关键软件。本文给出了软件可测试性，以前由Voas(1991,1992)定义，这是一个新的模型和测量，在针对特定输入分布进行随机黑盒测试之前完成。作者还将他们的测量结果与Voas模型模拟的结果进行了比较。它表明，他们粗略的可测试性估计提供了足够的信息，并将用作软件开发的指导方针。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

软件

自引率

0.00%

发文量

11857

期刊介绍： Computer engineering & Software, founded in 1979, is an academic journal of information technology sponsored by China Association for Science and Technology and China Institute of Electronics and Tianjin Institute of Electronics. Computer engineering & Software has columns such as expert Forum, Fund project papers, software and database technology research, application technology and research, network and communication, image processing and application, multimedia technology application Artificial intelligence and recognition. Computer engineering & Software is the source Journal of China Academic Periodical Comprehensive Evaluation Database, the Journal of China Core Periodical (Selection) Database, the source journal of Peking University's Chinese Core Periodical Overview (the first edition in 1992), the Journal of Wanfang data-Digital Periodical Group full-text Collection, the Journal of Chinese Science and Technology Periodical Database (full-text edition), and Wave Journals included in the "Copernicus Index" have been included in the United States "Cambridge Scientific Abstracts", the United States "Uhlig International Journal Guide", the JST Japan Science and Technology Promotion Agency database (2018) and other Chinese and foreign databases.