Synthesis, Structural and Dielectric Properties of SrBi1.8Ce0.2Ta2O9

Abstract

This Ce-doped strontium bismuth tantalate SrBi1.8Ce0.2Ta2O9 was prepared by solid-state reaction. X-ray diffraction was used to determine the crystal structure of the powders. The Raman spectrum of SrBi1.8Ce0.2Ta2O9 sample was measured to confirm X-ray diffraction result. The microstructure of ceramic was observed by Scanning Electron Microscope (SEM). The Temperature dependence of the dielectric properties of ceramic was investigated from the room temperature to 400°C.