Specular reflectance of silicon and germanium at variable angles of incidence in the infrared region

Abstract

The results of systematic measurements of specular reflectances of both single as well as double surface polished silicon and germanium at glancing angles of incidence from 10° to 70° in the infrared (IR) region of 2.5–25 μm have been discussed. The experimental results have been explained by comparison with the theoretical reflectance data obtained using Fresnel's theory.