Size Dependence of Linear Tension at a Curved Two-Dimensional Phase Boundary

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
M. A. Shebzukhova, K. Ch. Bzhikhatlov
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引用次数: 0

Abstract

In the framework of thermodynamics of surface and interphase boundaries, an equation is obtained for the dependence of linear tension on the radius of the tension line at the boundary of two-dimensional phases located on a flat surface and separated by a curved line. According to the obtained relationship, calculations have been carried out and the required dependence has been constructed in dimensionless coordinates (\({\tau \mathord{\left/ {\vphantom {\tau {{{\tau }_{\infty }}}}} \right. \kern-0em} {{{\tau }_{\infty }}}}\) and \({r \mathord{\left/ {\vphantom {r {{{\delta }_{\tau }}}}} \right. \kern-0em} {{{\delta }_{\tau }}}}\)), which is of a universal nature and does not depend on the specific nature of two-dimensional phases. The obtained curve is also of the universal nature according to the type of two-dimensional interface (liquid–vapor, solid–vapor, solid–liquid, solid–solid). In this work, a comparison is made with the solution of a similar problem of finding the dimensional dependence of surface tension on the nanoparticle size σ(r) for the cases of positive and negative curvature considered by the authors earlier.

Abstract Image

Abstract Image

二维曲线相边界上线张力的尺寸依赖性
在表面和相间边界热力学的框架下,得到了平面上以曲线分隔的二维相边界处的张力线半径与线性张力的关系方程。根据得到的关系进行了计算,并在无量纲坐标(\({\tau \mathord{\left/ {\vphantom {\tau {{{\tau }_{\infty }}}}} \right. \kern-0em} {{{\tau }_{\infty }}}}\)和\({r \mathord{\left/ {\vphantom {r {{{\delta }_{\tau }}}}} \right. \kern-0em} {{{\delta }_{\tau }}}}\))中构造了所需的依赖关系,这种关系具有普遍性,不依赖于二维相的具体性质。根据二维界面类型(液-气、固-气、固-液、固-固),所得曲线也具有普适性。在这项工作中,与先前作者考虑的正曲率和负曲率情况下表面张力对纳米颗粒尺寸σ(r)的尺寸依赖性的解决方法进行了比较。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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