In Memory of Wolter J. Fabrycky: A Pioneer of Systems Engineering and US-Sino Academic Exchange

IF 19.2 1区计算机科学 Q1 AUTOMATION & CONTROL SYSTEMS

Ieee-Caa Journal of Automatica Sinica Pub Date : 2025-03-15 DOI:10.1109/JAS.2025.125468

Fei-Yue Wang

引用次数: 0

Abstract

The passing of Professor Wolter “Wolt” Fabrycky, an outstanding member and great leader, is a big loss to our international systems engineering professional community. “Wolt was a legend in the systems engineering community with his teaching, advising, and dissemination of knowledge through the books he authored.”, as stated by Professor Eileen Aken, a former student of Wolt and the head of the Virginia Tech's Grado Department of Industrial and Systems Engineeirng where Wolt had served and led for 30 years and retired as John L. Lawrence Professor emeritus.

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纪念法布赖基：系统工程与中美学术交流的先驱

Wolter“Wolt”Fabrycky教授是一位杰出的成员和伟大的领导者，他的去世是我们国际系统工程专业社区的巨大损失。Wolt是系统工程界的传奇人物，他的教学、建议和通过他所写的书传播知识。艾琳·阿肯（Eileen Aken）教授如是说。艾琳·阿肯是沃尔特的前学生，也是弗吉尼亚理工大学格拉多工业与系统工程系的负责人，沃尔特在该学院工作并领导了30年，并以约翰·l·劳伦斯名誉教授的身份退休。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Ieee-Caa Journal of Automatica Sinica Engineering-Control and Systems Engineering

CiteScore

23.50

自引率

11.00%

发文量

880

期刊介绍： The IEEE/CAA Journal of Automatica Sinica is a reputable journal that publishes high-quality papers in English on original theoretical/experimental research and development in the field of automation. The journal covers a wide range of topics including automatic control, artificial intelligence and intelligent control, systems theory and engineering, pattern recognition and intelligent systems, automation engineering and applications, information processing and information systems, network-based automation, robotics, sensing and measurement, and navigation, guidance, and control. Additionally, the journal is abstracted/indexed in several prominent databases including SCIE (Science Citation Index Expanded), EI (Engineering Index), Inspec, Scopus, SCImago, DBLP, CNKI (China National Knowledge Infrastructure), CSCD (Chinese Science Citation Database), and IEEE Xplore.