Optical Properties of the Layered Phase of EuS2 near the Indirect Absorption Edge

Abstract

Reflection microscopy in the visible and near-infrared range is used to study optical properties of EuS₂ flakes. It is shown that for small flake areas, microreflection spectra can be adequately described by a model that combines the reflection of light from both the film‒substrate structure and the substrate. The indirect absorption edge (E_g = 0.83 eV) and the refractive index below the indirect absorption edge (n = 2.9) are determined from the microreflection spectra.