Real-Time Face and Facial Landmark Joint Detection Based on End-to-End Deep Network

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Qingtian Wu;Xiaoming Wang;Nannan Li;Simon Fong;Liming Zhang;Jinfeng Yang
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引用次数: 0

Abstract

Facial landmark detection (FLD) is an important task in computer vision, involving the extraction of keypoints from facial images. Traditional methods typically employ a two-stage approach: first detecting faces, then predicting facial landmarks. However, computing deep features for accurate face and landmark detection is time intensive, and the features from each stage are not shared. This makes these methods suboptimal for real-time applications, especially on edge devices. In this article, we present a novel end-to-end deep network for joint face and FLD. Our approach builds upon the YOLO framework with minimal modifications, primarily involving the adjustment of multitarget labels for face detection and the addition of a separate head for landmark localization. Furthermore, we enhance the model using structural reparameterization, channel shuffling, and implicit modules. Experimental evaluations on the 300 W dataset demonstrate that our proposed method achieves high accuracy while maintaining real-time processing speeds, surpassing several state-of-the-art (SOTA) methods. Additional testing on challenging datasets such as Caltech Occluded Faces in the Wild (COFW) and AFLW2000-3D further highlights the robustness of our model in diverse conditions. Our model and source code will be made publicly available.
基于端到端深度网络的实时人脸和人脸地标联合检测
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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