{"title":"Phase Fringe Suppression of Background Deformation for Nondestructive Testing Based on Shearography","authors":"Yonghong Wang;Zihua Zheng;Xiangwei Liu;Peizheng Yan;Junrui Li;Zhenmin Zhu","doi":"10.1109/TIM.2025.3541693","DOIUrl":null,"url":null,"abstract":"Shearography, a commonly utilized method for nondestructive testing (NDT), offers the advantage of full-field, noncontact, and real-time inspection across extensive viewing areas. Nonetheless, the effectiveness of defect detection using this method is frequently compromised by background deformation, posing challenges in accurately determining defect sizes and locations. This study investigates the deformation observed in specimens during shearography defect detection and introduces a background fringe suppression strategy based on deep learning. The aforementioned approach, which incorporates a robust dataset generation methodology and an advanced network architecture, excels at processing noisy wrapped phase maps, thereby efficiently discerning and mitigating background fringes. The effectiveness of the proposed method is corroborated through simulated and actual defect detection experiments, underscoring its potential in enhancing the precision of shearography defect detection.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-7"},"PeriodicalIF":5.6000,"publicationDate":"2025-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10884780/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Shearography, a commonly utilized method for nondestructive testing (NDT), offers the advantage of full-field, noncontact, and real-time inspection across extensive viewing areas. Nonetheless, the effectiveness of defect detection using this method is frequently compromised by background deformation, posing challenges in accurately determining defect sizes and locations. This study investigates the deformation observed in specimens during shearography defect detection and introduces a background fringe suppression strategy based on deep learning. The aforementioned approach, which incorporates a robust dataset generation methodology and an advanced network architecture, excels at processing noisy wrapped phase maps, thereby efficiently discerning and mitigating background fringes. The effectiveness of the proposed method is corroborated through simulated and actual defect detection experiments, underscoring its potential in enhancing the precision of shearography defect detection.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.