Bidirectional rapid sensing based on rare-earth upconversion nanoparticles for the ascorbic acid and hydrogen peroxide detection

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Guangliang Lu, Tianqi Wan, Dabiao Zhai, Rao Qin, Shuwen Li, Jiangang Jiang, Yiping Wang, Ruijin Yu, He Wang
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引用次数: 0

Abstract

The current detection methods for L-Ascorbic Acid (AA) and hydrogen peroxide (H2O2) often face limitations in sensitivity, rapidity, and practical application. Addressing these challenges, this study introduces a bidirectional rapid sensing platform based on rare-earth upconversion nanoparticles (UCNPs) for the detection of AA and H2O2. The developed probe, combining Tm-doped NaYF4 UCNPs with an iron chelate (SA-FeIII), leverages the inner filtration effect for efficient detection. By employing both fluorescence and colorimetric methods, the proposed system achieves linear detection ranges of 0–100 μM for AA and 0–71.7 μM for H2O2, with detection limits as low as 0.1 μM and 0.45 μM, respectively. Furthermore, a smartphone-based image analysis technique demonstrates the potential for rapid, on-site concentration measurements. This work significantly enhances the practicality of AA and H2O2 detection, offering a sensitive, fast, and user-friendly approach that holds promise for applications in clinical diagnostics, food safety, and agricultural stress monitoring.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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